TY - GEN
T1 - Ultra small fiber-optic electric field probe fabricated by aerosol deposition
AU - Iwanami, M.
AU - Nakada, M.
AU - Tsuda, H.
AU - Ohashi, K.
AU - Akedo, J.
PY - 2007/12/1
Y1 - 2007/12/1
N2 - We developed a microscopic electro-optic field probe by directly depositing a lead zirconate-titanate [PbZr0.3Ti0.7O3] film onto optical fiber edge using aerosol deposition. Its fabrication process is virtually self-aligning because there are no complicated procedures such as fine lithography and etching. The lateral size of the film pattern is 125 μm, which is the same as the diameter of a typical single mode fiber, and the thickness is approximately 5 μm. An RF electro-optic signal was successfully measured over a microstrip line. The measurable bandwidth of the probe was over 2 GHz. Because it is very tiny and thin, the developed electro-optic probe has great potential for detailed electrical characterization in the microscopic regions of high performance electronic products such as the interconnecting parts between LSI packages and printed circuit boards and spaces among different LSI chips in a package.
AB - We developed a microscopic electro-optic field probe by directly depositing a lead zirconate-titanate [PbZr0.3Ti0.7O3] film onto optical fiber edge using aerosol deposition. Its fabrication process is virtually self-aligning because there are no complicated procedures such as fine lithography and etching. The lateral size of the film pattern is 125 μm, which is the same as the diameter of a typical single mode fiber, and the thickness is approximately 5 μm. An RF electro-optic signal was successfully measured over a microstrip line. The measurable bandwidth of the probe was over 2 GHz. Because it is very tiny and thin, the developed electro-optic probe has great potential for detailed electrical characterization in the microscopic regions of high performance electronic products such as the interconnecting parts between LSI packages and printed circuit boards and spaces among different LSI chips in a package.
UR - http://www.scopus.com/inward/record.url?scp=51349104363&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=51349104363&partnerID=8YFLogxK
U2 - 10.1109/ISAF.2007.4393419
DO - 10.1109/ISAF.2007.4393419
M3 - Conference contribution
AN - SCOPUS:51349104363
SN - 1424413338
SN - 9781424413331
T3 - IEEE International Symposium on Applications of Ferroelectrics
SP - 834
EP - 837
BT - 2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF
T2 - 2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF
Y2 - 27 May 2007 through 31 May 2007
ER -