Unknown response masking with minimized observable response loss and mask data

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a new unknown response masking technique to minimize the effect on test loss due to over-masking. Unlike previous works where the scan responses are masked before entering the response compactor, the proposed method could mask the Xs when they are transformed on the scan path. Meanwhile, the masking cells are inserted along the scan paths, thus they would have no degradation on the performance of the designs. In addition, the test data required to mask unknown responses is only one bit for each test pattern. Experimental results show the effectiveness of the proposed method.

Original languageEnglish
Title of host publicationProceedings of APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems
Pages1779-1781
Number of pages3
DOIs
Publication statusPublished - 2008 Dec 1
EventAPCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems - Macao, China
Duration: 2008 Nov 302008 Dec 3

Publication series

NameIEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS

Conference

ConferenceAPCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems
CountryChina
CityMacao
Period08/11/3008/12/3

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Shi, Y., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2008). Unknown response masking with minimized observable response loss and mask data. In Proceedings of APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (pp. 1779-1781). [4746386] (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS). https://doi.org/10.1109/APCCAS.2008.4746386