TY - GEN
T1 - Unknown response masking with minimized observable response loss and mask data
AU - Shi, Youhua
AU - Togawa, Nozomu
AU - Yanagisawa, Masao
AU - Ohtsuki, Tatsuo
PY - 2008/12/1
Y1 - 2008/12/1
N2 - This paper presents a new unknown response masking technique to minimize the effect on test loss due to over-masking. Unlike previous works where the scan responses are masked before entering the response compactor, the proposed method could mask the Xs when they are transformed on the scan path. Meanwhile, the masking cells are inserted along the scan paths, thus they would have no degradation on the performance of the designs. In addition, the test data required to mask unknown responses is only one bit for each test pattern. Experimental results show the effectiveness of the proposed method.
AB - This paper presents a new unknown response masking technique to minimize the effect on test loss due to over-masking. Unlike previous works where the scan responses are masked before entering the response compactor, the proposed method could mask the Xs when they are transformed on the scan path. Meanwhile, the masking cells are inserted along the scan paths, thus they would have no degradation on the performance of the designs. In addition, the test data required to mask unknown responses is only one bit for each test pattern. Experimental results show the effectiveness of the proposed method.
UR - http://www.scopus.com/inward/record.url?scp=62949112418&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=62949112418&partnerID=8YFLogxK
U2 - 10.1109/APCCAS.2008.4746386
DO - 10.1109/APCCAS.2008.4746386
M3 - Conference contribution
AN - SCOPUS:62949112418
SN - 9781424423422
T3 - IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS
SP - 1779
EP - 1781
BT - Proceedings of APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems
T2 - APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems
Y2 - 30 November 2008 through 3 December 2008
ER -