Utility of the inverse partial fluorescence for electronic structure studies of battery materials

H. Wadati*, A. J. Achkar, D. G. Hawthorn, T. Z. Regier, M. P. Singh, K. D. Truong, P. Fournier, G. Chen, T. Mizokawa, G. A. Sawatzky

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

X-ray absorption spectroscopy is one of the most widely used experimental techniques to study the electronic and spatial structure of materials. Fluorescence yield mode is bulk-sensitive, but has several serious problems coming from saturation effects. In this study, we show the usefulness of partial fluorescence yields in addressing these problems. We discuss the different behaviors of La 2NiMnO 6 and LiMnO 2 at the Mn 2p absorption edges. The total fluorescence yield produces misleading spectra for LiMnO 2 due to the absence of high-Z (Z: atomic number) elements. We conclude that the measurement of the inverse partial fluorescence yield is essential in studies of LiMnO 2, which is a hotly debated Li-ion battery material.

Original languageEnglish
Article number193906
JournalApplied Physics Letters
Volume100
Issue number19
DOIs
Publication statusPublished - 2012 May 7
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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