V 2p core-level spectroscopy of V2+/V3+ mixed valence AV10O15 (A = Ba, Sr) and Ba0.9Sr0.1V13O18

S. Dash, Tomomasa Kajita, T. Yoshino, N. L. Saini, Takuro Katsufuji, Takashi Mizokawa

    Research output: Contribution to journalArticle

    2 Citations (Scopus)

    Abstract

    We have studied the surface electronic structure of AV10O15 (A = Ba, Sr) and Ba0.9Sr0.1V13O18 by using x-ray photoemission spectroscopy (XPS). The V 2p XPS shows multiple peaks associated with the charge fluctuation in the system. The relative intensity of each valence component can be extracted by Gaussian and Voigt fittings. The result strongly depends on the number of Gaussians/Voigts. In BaV10O15 and Ba0.9Sr0.1V13O18, the surface state has more V3+ than the bulk. In addition to the presence of surface V3+, the V2.5+ in AV10O15 (A = Ba, Sr) and V2+ in Ba0.9Sr0.1V13O18 systems are observed even in the surface sensitive XPS. The number of Gaussians/Voigts should be as large as four for the V 2p3/2, in order to obtain the results consistent with the bulk sensitive HAXPES study.

    Original languageEnglish
    Pages (from-to)11-20
    Number of pages10
    JournalJournal of Electron Spectroscopy and Related Phenomena
    Volume223
    DOIs
    Publication statusPublished - 2018 Feb 1

    Fingerprint

    Core levels
    Photoelectron spectroscopy
    Spectroscopy
    valence
    X rays
    photoelectric emission
    spectroscopy
    Surface states
    x rays
    Electronic structure
    electronic structure

    Keywords

    • Charge fluctuation
    • Peak fittings
    • Surface electronic properties
    • V Charge ordering/fluctuation
    • V Bond ordering
    • XPS

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Radiation
    • Atomic and Molecular Physics, and Optics
    • Condensed Matter Physics
    • Spectroscopy
    • Physical and Theoretical Chemistry

    Cite this

    V 2p core-level spectroscopy of V2+/V3+ mixed valence AV10O15 (A = Ba, Sr) and Ba0.9Sr0.1V13O18 . / Dash, S.; Kajita, Tomomasa; Yoshino, T.; Saini, N. L.; Katsufuji, Takuro; Mizokawa, Takashi.

    In: Journal of Electron Spectroscopy and Related Phenomena, Vol. 223, 01.02.2018, p. 11-20.

    Research output: Contribution to journalArticle

    @article{f82f836dddaf4bb0a5f511ca64253aa1,
    title = "V 2p core-level spectroscopy of V2+/V3+ mixed valence AV10O15 (A = Ba, Sr) and Ba0.9Sr0.1V13O18",
    abstract = "We have studied the surface electronic structure of AV10O15 (A = Ba, Sr) and Ba0.9Sr0.1V13O18 by using x-ray photoemission spectroscopy (XPS). The V 2p XPS shows multiple peaks associated with the charge fluctuation in the system. The relative intensity of each valence component can be extracted by Gaussian and Voigt fittings. The result strongly depends on the number of Gaussians/Voigts. In BaV10O15 and Ba0.9Sr0.1V13O18, the surface state has more V3+ than the bulk. In addition to the presence of surface V3+, the V2.5+ in AV10O15 (A = Ba, Sr) and V2+ in Ba0.9Sr0.1V13O18 systems are observed even in the surface sensitive XPS. The number of Gaussians/Voigts should be as large as four for the V 2p3/2, in order to obtain the results consistent with the bulk sensitive HAXPES study.",
    keywords = "Charge fluctuation, Peak fittings, Surface electronic properties, V Charge ordering/fluctuation, V Bond ordering, XPS",
    author = "S. Dash and Tomomasa Kajita and T. Yoshino and Saini, {N. L.} and Takuro Katsufuji and Takashi Mizokawa",
    year = "2018",
    month = "2",
    day = "1",
    doi = "10.1016/j.elspec.2017.12.002",
    language = "English",
    volume = "223",
    pages = "11--20",
    journal = "Journal of Electron Spectroscopy and Related Phenomena",
    issn = "0368-2048",
    publisher = "Elsevier",

    }

    TY - JOUR

    T1 - V 2p core-level spectroscopy of V2+/V3+ mixed valence AV10O15 (A = Ba, Sr) and Ba0.9Sr0.1V13O18

    AU - Dash, S.

    AU - Kajita, Tomomasa

    AU - Yoshino, T.

    AU - Saini, N. L.

    AU - Katsufuji, Takuro

    AU - Mizokawa, Takashi

    PY - 2018/2/1

    Y1 - 2018/2/1

    N2 - We have studied the surface electronic structure of AV10O15 (A = Ba, Sr) and Ba0.9Sr0.1V13O18 by using x-ray photoemission spectroscopy (XPS). The V 2p XPS shows multiple peaks associated with the charge fluctuation in the system. The relative intensity of each valence component can be extracted by Gaussian and Voigt fittings. The result strongly depends on the number of Gaussians/Voigts. In BaV10O15 and Ba0.9Sr0.1V13O18, the surface state has more V3+ than the bulk. In addition to the presence of surface V3+, the V2.5+ in AV10O15 (A = Ba, Sr) and V2+ in Ba0.9Sr0.1V13O18 systems are observed even in the surface sensitive XPS. The number of Gaussians/Voigts should be as large as four for the V 2p3/2, in order to obtain the results consistent with the bulk sensitive HAXPES study.

    AB - We have studied the surface electronic structure of AV10O15 (A = Ba, Sr) and Ba0.9Sr0.1V13O18 by using x-ray photoemission spectroscopy (XPS). The V 2p XPS shows multiple peaks associated with the charge fluctuation in the system. The relative intensity of each valence component can be extracted by Gaussian and Voigt fittings. The result strongly depends on the number of Gaussians/Voigts. In BaV10O15 and Ba0.9Sr0.1V13O18, the surface state has more V3+ than the bulk. In addition to the presence of surface V3+, the V2.5+ in AV10O15 (A = Ba, Sr) and V2+ in Ba0.9Sr0.1V13O18 systems are observed even in the surface sensitive XPS. The number of Gaussians/Voigts should be as large as four for the V 2p3/2, in order to obtain the results consistent with the bulk sensitive HAXPES study.

    KW - Charge fluctuation

    KW - Peak fittings

    KW - Surface electronic properties

    KW - V Charge ordering/fluctuation

    KW - V Bond ordering

    KW - XPS

    UR - http://www.scopus.com/inward/record.url?scp=85038807938&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=85038807938&partnerID=8YFLogxK

    U2 - 10.1016/j.elspec.2017.12.002

    DO - 10.1016/j.elspec.2017.12.002

    M3 - Article

    AN - SCOPUS:85038807938

    VL - 223

    SP - 11

    EP - 20

    JO - Journal of Electron Spectroscopy and Related Phenomena

    JF - Journal of Electron Spectroscopy and Related Phenomena

    SN - 0368-2048

    ER -