Variable-length coding with epsilon-fidelity criteria for general sources

Hideki Yagi, Ryo Nomura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

This paper addresses two problems of variablelength coding with a fidelity criterion for general sources, in which either the probability of codeword length overflow or that of excess distortion for a given threshold is allowed up to ϵ. In each problem, a general formula for the achievable region of coding rates and distortion levels is established via information spectrum methods. It is shown that there is a tight connection between the two problems, and the achievable regions are the same under a mild condition on the distortion measure. As a consequence, it turns out that superficially different general formulas for the two coding problems coincide with each other.

Original languageEnglish
Title of host publicationProceedings - 2015 IEEE International Symposium on Information Theory, ISIT 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2181-2185
Number of pages5
ISBN (Electronic)9781467377041
DOIs
Publication statusPublished - 2015 Sep 28
Externally publishedYes
EventIEEE International Symposium on Information Theory, ISIT 2015 - Hong Kong, Hong Kong
Duration: 2015 Jun 142015 Jun 19

Publication series

NameIEEE International Symposium on Information Theory - Proceedings
Volume2015-June
ISSN (Print)2157-8095

Other

OtherIEEE International Symposium on Information Theory, ISIT 2015
CountryHong Kong
CityHong Kong
Period15/6/1415/6/19

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ASJC Scopus subject areas

  • Theoretical Computer Science
  • Information Systems
  • Modelling and Simulation
  • Applied Mathematics

Cite this

Yagi, H., & Nomura, R. (2015). Variable-length coding with epsilon-fidelity criteria for general sources. In Proceedings - 2015 IEEE International Symposium on Information Theory, ISIT 2015 (pp. 2181-2185). [7282842] (IEEE International Symposium on Information Theory - Proceedings; Vol. 2015-June). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISIT.2015.7282842