Variable-length lossy source coding allowing some probability of union of overflow and excess distortion

Ryo Nomura, Hideki Yagi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We consider a new concept of achievability in the variable-length lossy source coding on the basis of the probability of the union of the overflow of codeword length and the excess distortion. In this setting, our main concern is to determine the achievable rate-distortion region for a given source and distortion measure. To this end, we first derive non-asymptotic upper and lower bounds, and then we derive general formulas of this achievable rate-distortion region in the first- and second-order sense. Finally, we apply our general formulas to stationary memoryless sources with an additive distortion measure.

Original languageEnglish
Title of host publicationProceedings - ISIT 2016; 2016 IEEE International Symposium on Information Theory
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2958-2962
Number of pages5
ISBN (Electronic)9781509018062
DOIs
Publication statusPublished - 2016 Aug 10
Externally publishedYes
Event2016 IEEE International Symposium on Information Theory, ISIT 2016 - Barcelona, Spain
Duration: 2016 Jul 102016 Jul 15

Publication series

NameIEEE International Symposium on Information Theory - Proceedings
Volume2016-August
ISSN (Print)2157-8095

Other

Other2016 IEEE International Symposium on Information Theory, ISIT 2016
CountrySpain
CityBarcelona
Period16/7/1016/7/15

ASJC Scopus subject areas

  • Theoretical Computer Science
  • Information Systems
  • Modelling and Simulation
  • Applied Mathematics

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    Nomura, R., & Yagi, H. (2016). Variable-length lossy source coding allowing some probability of union of overflow and excess distortion. In Proceedings - ISIT 2016; 2016 IEEE International Symposium on Information Theory (pp. 2958-2962). [7541841] (IEEE International Symposium on Information Theory - Proceedings; Vol. 2016-August). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISIT.2016.7541841