Versatile approach for frequency resolved wavefront characterization

Eugene Frumker, Gerhard G. Paulus, Hiromichi Niikura, David M. Villeneuve, Paul B. Corkum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Spatial characterization of high harmonics (HH) and XUV coherent radiation is of paramount importance, along with its temporal characterization. For many applications it will be necessary to accurately measure the beam properties, just as it is important to know the beam characteristics for many laser experiments. For example, high harmonics and attosecond pulses are being proposed as a front-end for the next generation X-ray free electron lasers. This oscillator-amplifier-like arrangement will require well characterized high harmonic sources. On the other hand, the electromagnetic radiation carries the combined signature of underlying quantum physical processes at the molecular level and of the cooperative phase matching. For example, accurate reconstruction of the high harmonic spatial wavefront, along with its temporal profile, gives us a complete range of tools to apply to the fundamental quantum properties and dynamics associated with high harmonic generation. We present a new concept of frequency resolved wavefront characterization that is particularly suitable for characterizing XUV radiation. In keeping with tradition in the area we give it an acronym - SWORD (Spectral Wavefront Optical Reconstruction by Diffraction). Our approach is based on an analysis of the diffraction pattern of a slit situated in front of a flat-field spectrometer. As the slit is scanned, the spectrally resolved diffraction pattern is recorded. Analyzing the measured diffractogram, we can reconstruct the wavefront. The technique can be easily extended beyond the XUV spectral region. When combined with temporal characterization techniques all information about the beam can be measured.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7925
DOIs
Publication statusPublished - 2011
Externally publishedYes
EventFrontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI - San Francisco, CA
Duration: 2011 Jan 232011 Jan 26

Other

OtherFrontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI
CitySan Francisco, CA
Period11/1/2311/1/26

Fingerprint

Wavefronts
Wave Front
Harmonic
harmonics
Diffraction
Radiation
Diffraction patterns
slits
diffraction patterns
X ray lasers
Acronym
X-ray Laser
Harmonic Generation
abbreviations
Free Electron Laser
Phase matching
Light amplifiers
coherent radiation
Free electron lasers
Physical process

Keywords

  • attosecond pulses
  • high harmonics
  • wavefront sensing
  • XUV coherent radiation

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Frumker, E., Paulus, G. G., Niikura, H., Villeneuve, D. M., & Corkum, P. B. (2011). Versatile approach for frequency resolved wavefront characterization. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7925). [79250U] https://doi.org/10.1117/12.886304

Versatile approach for frequency resolved wavefront characterization. / Frumker, Eugene; Paulus, Gerhard G.; Niikura, Hiromichi; Villeneuve, David M.; Corkum, Paul B.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7925 2011. 79250U.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Frumker, E, Paulus, GG, Niikura, H, Villeneuve, DM & Corkum, PB 2011, Versatile approach for frequency resolved wavefront characterization. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7925, 79250U, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI, San Francisco, CA, 11/1/23. https://doi.org/10.1117/12.886304
Frumker E, Paulus GG, Niikura H, Villeneuve DM, Corkum PB. Versatile approach for frequency resolved wavefront characterization. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7925. 2011. 79250U https://doi.org/10.1117/12.886304
Frumker, Eugene ; Paulus, Gerhard G. ; Niikura, Hiromichi ; Villeneuve, David M. ; Corkum, Paul B. / Versatile approach for frequency resolved wavefront characterization. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7925 2011.
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