Weak localization, fluctuation, and superconductivity in thin Nb films and wires

Makoto Hikita, Yukimichi Tajima, Toshiaki Tamamura, Susumu Kurihara

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Weak localization, fluctuation conductivity, and related problems have been investigated based on a comprehensive set of experiments on transition metal Nb films and wires. The temperature dependence of the inelastic scattering rate 1/ of films with various thicknesses (25 80), estimated from magnetoresistance data above Tc, is well fitted to a function of C0+C1T+C3T3. The coefficient C1 is in excellent quantitative agreement with the theoretical prediction of the electron-electron scattering mechanism for two-dimensional dirty metals. The coefficient C3 shows no thickness dependence and is in semiquantitative agreement with theories of three-dimensional electron-phonon scattering mechanisms. The upper critical field of thin Nb wires with a width of less than 1000 exhibits unconventional temperature dependence close to Tc. We also discuss this behavior.

Original languageEnglish
Pages (from-to)118-126
Number of pages9
JournalPhysical Review B
Volume42
Issue number1
DOIs
Publication statusPublished - 1990
Externally publishedYes

Fingerprint

Electron scattering
Superconductivity
superconductivity
wire
Wire
Thin films
temperature dependence
Inelastic scattering
Phonon scattering
Magnetoresistance
coefficients
thin films
metal films
Transition metals
electron scattering
inelastic scattering
electrons
Metals
transition metals
conductivity

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Weak localization, fluctuation, and superconductivity in thin Nb films and wires. / Hikita, Makoto; Tajima, Yukimichi; Tamamura, Toshiaki; Kurihara, Susumu.

In: Physical Review B, Vol. 42, No. 1, 1990, p. 118-126.

Research output: Contribution to journalArticle

Hikita, Makoto ; Tajima, Yukimichi ; Tamamura, Toshiaki ; Kurihara, Susumu. / Weak localization, fluctuation, and superconductivity in thin Nb films and wires. In: Physical Review B. 1990 ; Vol. 42, No. 1. pp. 118-126.
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