Weakly singular BIEM for analysis of cracks embedded in symmetric elastic whole space

T. N. Pham, J. Rungamornrat, W. Pansuk, Y. Sato

Research output: Contribution to journalArticlepeer-review

Fingerprint Dive into the research topics of 'Weakly singular BIEM for analysis of cracks embedded in symmetric elastic whole space'. Together they form a unique fingerprint.

Engineering & Materials Science