Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability

Yasumasa Tsukamoto*, Koji Nii, Susumu Imaoka, Yuji Oda, Shigeki Ohbayashi, Tomoaki Yoshizawa, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

46 Citations (Scopus)

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Engineering & Materials Science