X-handling for current X-tolerant compactors with more unknowns and maximal compaction

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    Abstract

    This paper presents a novel X-handling technique, which removes the effect of unknowns on compacted test response with maximal compaction ratio. The proposed method combines with the current X-tolerant compactors and inserts masking cells on scan paths to selectively mask X's. By doing this, the number of unknown responses in each scan-out cycle could be reduced to a reasonable level such that the target X-tolerant compactor would tolerate with guaranteed possible error detection. It guarantees no test loss due to the effect of X's, and achieves the maximal compaction that the target response compactor could provide as well. Moreover, because the masking cells are only inserted on the scan paths, it has no performance degradation of the designs. Experimental results demonstrate the effectiveness of the proposed method.

    Original languageEnglish
    Pages (from-to)3119-3127
    Number of pages9
    JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
    VolumeE92-A
    Issue number12
    DOIs
    Publication statusPublished - 2009 Dec

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    Keywords

    • Scan test
    • Test data compression
    • X-masking

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Computer Graphics and Computer-Aided Design
    • Applied Mathematics
    • Signal Processing

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