X-Ray diffraction properties of silica thin films having single crystalline mesoporous structures

Takashi Noma, Hirokatsu Miyata, Kazuhiro Takada, Atsuo Iida

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Detailed X-ray diffraction study of silica films with single crystalline mesoporous structures shows that the behavior of X-rays in these mesoporous materials with nano-scaled structural regularity is quite identical to that in real crystals.

Original languageEnglish
Title of host publicationOptical Interference Coatings, OIC 2007
PublisherOptical Society of America (OSA)
ISBN (Print)1557528411, 9781557528414
DOIs
Publication statusPublished - 2007
Externally publishedYes
EventOptical Interference Coatings, OIC 2007 - Tucson, AZ, United States
Duration: 2007 Jun 32007 Jun 3

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceOptical Interference Coatings, OIC 2007
CountryUnited States
CityTucson, AZ
Period07/6/307/6/3

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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