X-RAY FLUORESCENCE ANALYSIS OF SILICATE ROCKS.

Etsuo Uchida, Yoshihide Watanabe, Tadaharu Nakamura, Naoya Imai

    Research output: Contribution to journalArticle

    Abstract

    Calibration curves for the analysis of 12 trace elements Zr, Sr, Rb, Th, Pb, Zn, Cu, Ni, Co, Mn, Cr and Cl in silicate rocks were obtained using the X-ray fluorescence spectrometer, JEOL JSX-60PX with eight standard rocks JB-la, JB-2, JB-3, JGb-1, JA-1, JA-2, JG-1a, JR-1 and JR-2 provided by Geological Survey of Japan. A pressed powder method was employed for the measurement. Background, matrix and standardization corrections were carried out for the measured intensities of characteristic X-rays. The errors of analysis for JB-1a are within 5% for Sr, Ni, Mn and Cr, 5 to 10% for Zr, Zn and Rb, and more than 10% for Th, Pb, Cu, Cl and Co.

    Original languageEnglish
    Pages (from-to)45-52
    Number of pages8
    JournalWaseda Daigaku Rikogaku Kenkyusho Hokoku/Bulletin of Science and Engineering Research Laboratory,
    Issue number118
    Publication statusPublished - 1987

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    Silicates
    Fluorescence
    Rocks
    X rays
    Geological surveys
    Trace elements
    X ray powder diffraction
    Standardization
    Spectrometers
    Calibration

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    X-RAY FLUORESCENCE ANALYSIS OF SILICATE ROCKS. / Uchida, Etsuo; Watanabe, Yoshihide; Nakamura, Tadaharu; Imai, Naoya.

    In: Waseda Daigaku Rikogaku Kenkyusho Hokoku/Bulletin of Science and Engineering Research Laboratory, No. 118, 1987, p. 45-52.

    Research output: Contribution to journalArticle

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    AU - Imai, Naoya

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