X-RAY FLUORESCENCE ANALYSIS OF SILICATE ROCKS.

Etsuo Uchida, Yoshihide Watanabe, Tadaharu Nakamura, Naoya Imai

Research output: Contribution to journalArticle

Abstract

Calibration curves for the analysis of 12 trace elements Zr, Sr, Rb, Th, Pb, Zn, Cu, Ni, Co, Mn, Cr and Cl in silicate rocks were obtained using the X-ray fluorescence spectrometer, JEOL JSX-60PX with eight standard rocks JB-la, JB-2, JB-3, JGb-1, JA-1, JA-2, JG-1a, JR-1 and JR-2 provided by Geological Survey of Japan. A pressed powder method was employed for the measurement. Background, matrix and standardization corrections were carried out for the measured intensities of characteristic X-rays. The errors of analysis for JB-1a are within 5% for Sr, Ni, Mn and Cr, 5 to 10% for Zr, Zn and Rb, and more than 10% for Th, Pb, Cu, Cl and Co.

Original languageEnglish
Pages (from-to)45-52
Number of pages8
JournalWaseda Daigaku Rikogaku Kenkyusho Hokoku/Bulletin of Science and Engineering Research Laboratory,
Issue number118
Publication statusPublished - 1987 Dec 1

ASJC Scopus subject areas

  • Engineering(all)

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