X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy

Y. Kotani, T. Taniuchi, M. Osada, T. Sasaki, M. Kotsugi, T. Ohkochi, Y. Watanabe, K. Ono

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10-18gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80nm×80nm. area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
Pages437-440
Number of pages4
Volume1234
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 - Melbourne, VIC, Australia
Duration: 2009 Sep 272009 Oct 2

Other

Other10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009
CountryAustralia
CityMelbourne, VIC
Period09/9/2709/10/2

Fingerprint

photoelectrons
microscopy
x ray absorption
x rays
x ray spectra
image analysis
illuminating
x ray spectroscopy
Japan
electron microscopy
absorption spectroscopy
photoelectric emission
spatial resolution
electronic structure
absorption spectra
energy
high resolution
photons

Keywords

  • PEEM
  • two-dimensional nanomaterials
  • x-ray absorption spectroscopy

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Kotani, Y., Taniuchi, T., Osada, M., Sasaki, T., Kotsugi, M., Ohkochi, T., ... Ono, K. (2010). X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy. In AIP Conference Proceedings (Vol. 1234, pp. 437-440) https://doi.org/10.1063/1.3463234

X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy. / Kotani, Y.; Taniuchi, T.; Osada, M.; Sasaki, T.; Kotsugi, M.; Ohkochi, T.; Watanabe, Y.; Ono, K.

AIP Conference Proceedings. Vol. 1234 2010. p. 437-440.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kotani, Y, Taniuchi, T, Osada, M, Sasaki, T, Kotsugi, M, Ohkochi, T, Watanabe, Y & Ono, K 2010, X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy. in AIP Conference Proceedings. vol. 1234, pp. 437-440, 10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009, Melbourne, VIC, Australia, 09/9/27. https://doi.org/10.1063/1.3463234
Kotani Y, Taniuchi T, Osada M, Sasaki T, Kotsugi M, Ohkochi T et al. X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy. In AIP Conference Proceedings. Vol. 1234. 2010. p. 437-440 https://doi.org/10.1063/1.3463234
Kotani, Y. ; Taniuchi, T. ; Osada, M. ; Sasaki, T. ; Kotsugi, M. ; Ohkochi, T. ; Watanabe, Y. ; Ono, K. / X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy. AIP Conference Proceedings. Vol. 1234 2010. pp. 437-440
@inproceedings{952b4d786355439fbc30b839911d0e8e,
title = "X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy",
abstract = "We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10-18gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80nm×80nm. area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.",
keywords = "PEEM, two-dimensional nanomaterials, x-ray absorption spectroscopy",
author = "Y. Kotani and T. Taniuchi and M. Osada and T. Sasaki and M. Kotsugi and T. Ohkochi and Y. Watanabe and K. Ono",
year = "2010",
doi = "10.1063/1.3463234",
language = "English",
isbn = "9780735407824",
volume = "1234",
pages = "437--440",
booktitle = "AIP Conference Proceedings",

}

TY - GEN

T1 - X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy

AU - Kotani, Y.

AU - Taniuchi, T.

AU - Osada, M.

AU - Sasaki, T.

AU - Kotsugi, M.

AU - Ohkochi, T.

AU - Watanabe, Y.

AU - Ono, K.

PY - 2010

Y1 - 2010

N2 - We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10-18gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80nm×80nm. area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.

AB - We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10-18gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80nm×80nm. area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.

KW - PEEM

KW - two-dimensional nanomaterials

KW - x-ray absorption spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=77955044891&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77955044891&partnerID=8YFLogxK

U2 - 10.1063/1.3463234

DO - 10.1063/1.3463234

M3 - Conference contribution

SN - 9780735407824

VL - 1234

SP - 437

EP - 440

BT - AIP Conference Proceedings

ER -