X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy

Y. Kotani, T. Taniuchi, M. Osada, T. Sasaki, M. Kotsugi, T. Ohkochi, Y. Watanabe, K. Ono

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10-18gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80nm×80nm. area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
Pages437-440
Number of pages4
Volume1234
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 - Melbourne, VIC, Australia
Duration: 2009 Sep 272009 Oct 2

Other

Other10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009
CountryAustralia
CityMelbourne, VIC
Period09/9/2709/10/2

Keywords

  • PEEM
  • two-dimensional nanomaterials
  • x-ray absorption spectroscopy

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Kotani, Y., Taniuchi, T., Osada, M., Sasaki, T., Kotsugi, M., Ohkochi, T., Watanabe, Y., & Ono, K. (2010). X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy. In AIP Conference Proceedings (Vol. 1234, pp. 437-440) https://doi.org/10.1063/1.3463234