X-ray photoemission spectroscopy studies of conducting polymer-substrate interfaces: Interfacial electrochemical diffusion

Hitoshi Kato, Susumu Takemura, Yasushi Nakajima

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Interfaces between conducting polymer polypyrrole (PP) and transparent conductive materials such as indium tin oxide (ITO) and SnO2 were investigated by x-ray photoemission spectroscopy (XPS). XPS lines of In 3d5/2,3/2 and Sn 3d5/2,3/2 were observed in the XPS spectra of electrochemically reduced PP film sides of PP/ITO and PP/SnO2, respectively. The results indicate that electrochemical diffusion of substrate materials into conducting polymer films takes place by applying negative voltage to the substrate. The energy positions of the 3d lines of the diffused In and Sn which are close to those of the metal oxides support the proposition that the diffused species are metal oxide ions. In the electrochemically diffused PP/ITO and PP/SnO2 interfaces, XPS spectra of substrate sides exhibit In 3d and Sn 3d lines associated with satellite peaks, which indicates magnetic splitting of 3d levels or electron transfer typed shake-up. This indicates that electrochemical diffusion affects the substrate electronically.

Original languageEnglish
Pages (from-to)7313-7316
Number of pages4
JournalJournal of Applied Physics
Volume81
Issue number11
Publication statusPublished - 1997 Jun 1

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polypyrroles
conducting polymers
photoelectric emission
indium oxides
spectroscopy
tin oxides
polymers
x rays
metal oxides
electron transfer
electric potential
ions

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physics and Astronomy (miscellaneous)

Cite this

X-ray photoemission spectroscopy studies of conducting polymer-substrate interfaces : Interfacial electrochemical diffusion. / Kato, Hitoshi; Takemura, Susumu; Nakajima, Yasushi.

In: Journal of Applied Physics, Vol. 81, No. 11, 01.06.1997, p. 7313-7316.

Research output: Contribution to journalArticle

Kato, Hitoshi ; Takemura, Susumu ; Nakajima, Yasushi. / X-ray photoemission spectroscopy studies of conducting polymer-substrate interfaces : Interfacial electrochemical diffusion. In: Journal of Applied Physics. 1997 ; Vol. 81, No. 11. pp. 7313-7316.
@article{9cec5bb049a9452b94c23e187b5f359e,
title = "X-ray photoemission spectroscopy studies of conducting polymer-substrate interfaces: Interfacial electrochemical diffusion",
abstract = "Interfaces between conducting polymer polypyrrole (PP) and transparent conductive materials such as indium tin oxide (ITO) and SnO2 were investigated by x-ray photoemission spectroscopy (XPS). XPS lines of In 3d5/2,3/2 and Sn 3d5/2,3/2 were observed in the XPS spectra of electrochemically reduced PP film sides of PP/ITO and PP/SnO2, respectively. The results indicate that electrochemical diffusion of substrate materials into conducting polymer films takes place by applying negative voltage to the substrate. The energy positions of the 3d lines of the diffused In and Sn which are close to those of the metal oxides support the proposition that the diffused species are metal oxide ions. In the electrochemically diffused PP/ITO and PP/SnO2 interfaces, XPS spectra of substrate sides exhibit In 3d and Sn 3d lines associated with satellite peaks, which indicates magnetic splitting of 3d levels or electron transfer typed shake-up. This indicates that electrochemical diffusion affects the substrate electronically.",
author = "Hitoshi Kato and Susumu Takemura and Yasushi Nakajima",
year = "1997",
month = "6",
day = "1",
language = "English",
volume = "81",
pages = "7313--7316",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "11",

}

TY - JOUR

T1 - X-ray photoemission spectroscopy studies of conducting polymer-substrate interfaces

T2 - Interfacial electrochemical diffusion

AU - Kato, Hitoshi

AU - Takemura, Susumu

AU - Nakajima, Yasushi

PY - 1997/6/1

Y1 - 1997/6/1

N2 - Interfaces between conducting polymer polypyrrole (PP) and transparent conductive materials such as indium tin oxide (ITO) and SnO2 were investigated by x-ray photoemission spectroscopy (XPS). XPS lines of In 3d5/2,3/2 and Sn 3d5/2,3/2 were observed in the XPS spectra of electrochemically reduced PP film sides of PP/ITO and PP/SnO2, respectively. The results indicate that electrochemical diffusion of substrate materials into conducting polymer films takes place by applying negative voltage to the substrate. The energy positions of the 3d lines of the diffused In and Sn which are close to those of the metal oxides support the proposition that the diffused species are metal oxide ions. In the electrochemically diffused PP/ITO and PP/SnO2 interfaces, XPS spectra of substrate sides exhibit In 3d and Sn 3d lines associated with satellite peaks, which indicates magnetic splitting of 3d levels or electron transfer typed shake-up. This indicates that electrochemical diffusion affects the substrate electronically.

AB - Interfaces between conducting polymer polypyrrole (PP) and transparent conductive materials such as indium tin oxide (ITO) and SnO2 were investigated by x-ray photoemission spectroscopy (XPS). XPS lines of In 3d5/2,3/2 and Sn 3d5/2,3/2 were observed in the XPS spectra of electrochemically reduced PP film sides of PP/ITO and PP/SnO2, respectively. The results indicate that electrochemical diffusion of substrate materials into conducting polymer films takes place by applying negative voltage to the substrate. The energy positions of the 3d lines of the diffused In and Sn which are close to those of the metal oxides support the proposition that the diffused species are metal oxide ions. In the electrochemically diffused PP/ITO and PP/SnO2 interfaces, XPS spectra of substrate sides exhibit In 3d and Sn 3d lines associated with satellite peaks, which indicates magnetic splitting of 3d levels or electron transfer typed shake-up. This indicates that electrochemical diffusion affects the substrate electronically.

UR - http://www.scopus.com/inward/record.url?scp=0000194268&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0000194268&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0000194268

VL - 81

SP - 7313

EP - 7316

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 11

ER -