年別の研究成果
年別の研究成果
フィンガープリント
Hirofumi Shinoharaが活動している研究トピックを掘り下げます。このトピックラベルは、この研究者の研究成果に基づきます。これらがまとまってユニークなフィンガープリントを構成します。
- 12 類似のプロファイル
ネットワーク
国レベルでの最近の外部協力。点をクリックして確認してください。
研究成果
-
36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate through In-Cell Hot-Carrier Injection Burn-In
Liu, K., Fu, Z., Li, G., Pu, H., Guan, Z., Wang, X., Chen, X. & Shinohara, H., 2021 2 13, 2021 IEEE International Solid-State Circuits Conference, ISSCC 2021 - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc., p. 502-504 3 p. 9365942. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 64).研究成果: Conference contribution
-
Session 36 Overview: Hardware Security Digital Architectures and Systems Subcommittee
Shinohara, H., Alioto, M. & Verbauwhede, I., 2021 2 13, In: Digest of Technical Papers - IEEE International Solid-State Circuits Conference. 64, p. 496-497 2 p., 9365930.研究成果: Editorial › 査読
Open Access -
A 0.5-V 2.07-fJ/b 497-F2 EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in
Liu, K., Pu, H. & Shinohara, H., 2020 3, 2020 IEEE Custom Integrated Circuits Conference, CICC 2020. Institute of Electrical and Electronics Engineers Inc., 9075875. (Proceedings of the Custom Integrated Circuits Conference; vol. 2020-March).研究成果: Conference contribution
2 被引用数 (Scopus) -
A 373-F 0.21%-Native-BER EE SRAM Physically Unclonable Function with 2-D Power-Gated Bit Cells and {V}_{\text{SS}} Bias-Based Dark-Bit Detection
Liu, K., Min, Y., Yang, X., Sun, H. & Shinohara, H., 2020 6, In: IEEE Journal of Solid-State Circuits. 55, 6, p. 1719-1732 14 p., 8957039.研究成果: Article › 査読
3 被引用数 (Scopus) -
An Inverter-Based True Random Number Generator with 4-bit Von-Neumann Post-Processing Circuit
Wang, X., Liu, H., Zhang, R., Liu, K. & Shinohara, H., 2020 8, 2020 IEEE 63rd International Midwest Symposium on Circuits and Systems, MWSCAS 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 285-288 4 p. 9184449. (Midwest Symposium on Circuits and Systems; vol. 2020-August).研究成果: Conference contribution