年単位の研究成果
Fingerprint Takashi Ohsawaが取り組む研究トピックをご確認ください。これらのトピックラベルは、この人物の研究に基づいています。これらを共に使用することで、固有の認識が可能になります。
- 12 同様のプロファイル
Dynamic random access storage
Engineering & Materials Science
Data storage equipment
Engineering & Materials Science
Random access storage
Engineering & Materials Science
Tunnel junctions
Engineering & Materials Science
Transistors
Engineering & Materials Science
tunnel junctions
Physics & Astronomy
floating
Physics & Astronomy
cells
Physics & Astronomy
ネットワーク
最近の共同研究。丸をクリックして詳細を確認しましょう。
研究成果 1979 2019
Accurate measurement of sneak current in reram crossbar array with data storage pattern dependencies
Shang, Y. & Ohsawa, T., 2019 4 1, 2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019. Institute of Electrical and Electronics Engineers Inc., 8804668. (2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019).研究成果: Conference contribution
Data storage equipment
Compensation and Redress
RRAM
Direction compound
Cell array design with row-driven source line in block shunt architecture applicable to future 6f2 1t1mtj memory
Huang, T. & Ohsawa, T., 2019 4 1, 2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019. Institute of Electrical and Electronics Engineers Inc., 8804671. (2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019).研究成果: Conference contribution
Data storage equipment
Degradation
Co-design of DNN model optimization for binary ReRAM array in-memory processing
Guan, Y. & Ohsawa, T., 2019 5 1, 2019 IEEE 11th International Memory Workshop, IMW 2019. Institute of Electrical and Electronics Engineers Inc., 8739722. (2019 IEEE 11th International Memory Workshop, IMW 2019).研究成果: Conference contribution
Data storage equipment
Processing
Hardware
RRAM
Deep neural networks
User-friendly compact model of magnetic tunnel junctions for circuit simulation based on switching probability
Liu, H. & Ohsawa, T., 2019 4 1, 2019 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019. Institute of Electrical and Electronics Engineers Inc., 8741646. (2019 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019).研究成果: Conference contribution
Tunnel junctions
Circuit simulation
tunnel junctions
simulation
hybrid circuits
A new read scheme for high-density emerging memories
Ohsawa, T., 2018 6 1, ： : IEICE Transactions on Electronics. E101C, 6, p. 423-429 7 p.研究成果: Article
Data storage equipment
Dynamic random access storage