1.2-V 101-GHz W-band power amplifier integrated in a 65-nm CMOS technology

Uroschanit Yodprasit, Kosuke Katayama, Ryuichi Fujimoto, Mizuki Motoyoshi, Minoru Fujishima

研究成果: Conference contribution

2 引用 (Scopus)

抜粋

In this paper, design and characterization of a medium-power power amplifier targeted for short-range wireless communications in W-band frequency are presented. The power amplifier consists of six stages of common-source gain stages biased in class-A mode to maximize the power gain. The matching networks are based on slow-wave transmission lines in order to compact the layout. Fabricated in a 65-nm CMOS process, the power amplifier achieves a maximum power gain of 8.5 dB at 101 GHz and a 3-dB bandwidth of 18 GHz. The power amplifier delivers a saturation power of 7.1 dBm using a 1.2-V supply voltage and consumes 189 mW.

元の言語English
ホスト出版物のタイトル2013 IEEE International Semiconductor Conference Dresden - Grenoble
ホスト出版物のサブタイトルTechnology, Design, Packaging, Simulation and Test, ISCDG 2013
DOI
出版物ステータスPublished - 2013 12 1
イベント2013 IEEE International Semiconductor Conference Dresden - Grenoble: Technology, Design, Packaging, Simulation and Test, ISCDG 2013 - Dresden, Germany
継続期間: 2013 9 262013 9 27

出版物シリーズ

名前2013 IEEE International Semiconductor Conference Dresden - Grenoble: Technology, Design, Packaging, Simulation and Test, ISCDG 2013

Other

Other2013 IEEE International Semiconductor Conference Dresden - Grenoble: Technology, Design, Packaging, Simulation and Test, ISCDG 2013
Germany
Dresden
期間13/9/2613/9/27

    フィンガープリント

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

これを引用

Yodprasit, U., Katayama, K., Fujimoto, R., Motoyoshi, M., & Fujishima, M. (2013). 1.2-V 101-GHz W-band power amplifier integrated in a 65-nm CMOS technology. : 2013 IEEE International Semiconductor Conference Dresden - Grenoble: Technology, Design, Packaging, Simulation and Test, ISCDG 2013 [6656291] (2013 IEEE International Semiconductor Conference Dresden - Grenoble: Technology, Design, Packaging, Simulation and Test, ISCDG 2013). https://doi.org/10.1109/ISCDG.2013.6656291