5-V-only one-transistor 256K EEPROM with page-mode erase

Takeshi Nakayama, Yoshikazu Miyawaki, Kazuo Kobayashi, Yasushi Terada, Hideaki Arima, Takayuki Matsukawa, Tsutomu Yoshihara

研究成果: Article

6 引用 (Scopus)

抜粋

Erasing and programming are achieved in the device through electron tunneling. In order to inhibit the programming to unselected cells, the unselected bit lines and word lines are applied with program-inhibiting voltages. The number of parity bits for error checking and correction (ECC) is five per 2 bytes, which are controlled by the lower byte (LB) signal. Using a conventional 1.5-μm design rule n-well CMOS process with a single metal layer and two polysilicon layers, the memory cell size is 7 × 8 μm2 and the chip size is 5.55 × 7.05 mm2. The chip size is reduced to 70% of a full-featured electrically erasable programmable ROM (EEPROM) with on-chip ECC.

元の言語English
ページ(範囲)911-915
ページ数5
ジャーナルIEEE Journal of Solid-State Circuits
24
発行部数4
DOI
出版物ステータスPublished - 1989 8
外部発表Yes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • これを引用

    Nakayama, T., Miyawaki, Y., Kobayashi, K., Terada, Y., Arima, H., Matsukawa, T., & Yoshihara, T. (1989). 5-V-only one-transistor 256K EEPROM with page-mode erase. IEEE Journal of Solid-State Circuits, 24(4), 911-915. https://doi.org/10.1109/4.34070