A Built-in Reseeding Technique for LFSR-Based Test Pattern Generation

Youhua Shi*, Zhe Zhang, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki

*この研究の対応する著者

研究成果: Article査読

抄録

Reseeding technique is proposed to improve the fault coverage in pseudo-random testing. However most of previous works on reseeding is based on storing the seeds in an external tester or in a ROM. In this paper we present a built-in reseeding technique for LFSR-based test pattern generation. The proposed structure can run both in pseudorandom mode and in reseeding mode. Besides, our method requires no storage for the seeds since in reseeding mode the seeds can be generated automatically in hardware. In this paper we also propose an efficient grouping algorithm based on simulated annealing to optimize test vector grouping. Experimental results for benchmark circuits indicate the superiority of our technique against other reseeding methods with respect to test length and area overhead. Moreover, since the theoretical properties of LFSRs are preserved, our method could be beneficially used in conjunction with any other techniques proposed so far.

本文言語English
ページ(範囲)3056-3062
ページ数7
ジャーナルIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
E86-A
12
出版ステータスPublished - 2003 12

ASJC Scopus subject areas

  • 信号処理
  • コンピュータ グラフィックスおよびコンピュータ支援設計
  • 電子工学および電気工学
  • 応用数学

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