A Built-in Reseeding Technique for LFSR-Based Test Pattern Generation

Youhua Shi, Zhe Zhang, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki

研究成果: Article

抜粋

Reseeding technique is proposed to improve the fault coverage in pseudo-random testing. However most of previous works on reseeding is based on storing the seeds in an external tester or in a ROM. In this paper we present a built-in reseeding technique for LFSR-based test pattern generation. The proposed structure can run both in pseudorandom mode and in reseeding mode. Besides, our method requires no storage for the seeds since in reseeding mode the seeds can be generated automatically in hardware. In this paper we also propose an efficient grouping algorithm based on simulated annealing to optimize test vector grouping. Experimental results for benchmark circuits indicate the superiority of our technique against other reseeding methods with respect to test length and area overhead. Moreover, since the theoretical properties of LFSRs are preserved, our method could be beneficially used in conjunction with any other techniques proposed so far.

元の言語English
ページ(範囲)3056-3062
ページ数7
ジャーナルIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
E86-A
発行部数12
出版物ステータスPublished - 2003 12

ASJC Scopus subject areas

  • Signal Processing
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering
  • Applied Mathematics

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