A field study of lightning surges propagating into residences

Teru Miyazaki, Tsunayoshi Ishii, Shigemitsu Okabe

研究成果: Article

21 引用 (Scopus)

抄録

In the highly information-based society of today, lightning damage to home electric appliances, such as personal computers and facsimile machines is having a greater impact, indicating a growing public interest in countermeasures for lightning. However, many things remain unknown about lightning surges that propagate into residences. The Tokyo Electric Power Company had observed the patterns of intrusion of lightning surges into residences using lightning surge waveform detectors installed at ordinary residences and obtained observation data on 18 lightning strokes between 2003 and 2006. These observation results can be used to examine the patterns of propagation of lightning surges into residences. In some observation cases of lightning strokes to the ground, lightning surge currents were estimated to flow from the ground into residences. These valuable data will be useful for elucidating the lightning surge propagation in the low-voltage distribution system including residences.

元の言語English
記事番号5460926
ページ(範囲)921-928
ページ数8
ジャーナルIEEE Transactions on Electromagnetic Compatibility
52
発行部数4
DOI
出版物ステータスPublished - 2010 11 1
外部発表Yes

Fingerprint

lightning
Lightning
strokes
electric equipment
Electric appliances
Facsimile
countermeasures
propagation
personal computers
electric power
intrusion
Personal computers
low voltage
waveforms
damage
Detectors
detectors

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

これを引用

A field study of lightning surges propagating into residences. / Miyazaki, Teru; Ishii, Tsunayoshi; Okabe, Shigemitsu.

:: IEEE Transactions on Electromagnetic Compatibility, 巻 52, 番号 4, 5460926, 01.11.2010, p. 921-928.

研究成果: Article

Miyazaki, Teru ; Ishii, Tsunayoshi ; Okabe, Shigemitsu. / A field study of lightning surges propagating into residences. :: IEEE Transactions on Electromagnetic Compatibility. 2010 ; 巻 52, 番号 4. pp. 921-928.
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