A large-solid-angle electron energy analyzer (II)

Takeshi Nakajima; Daisuke Miura; Kenta Yamamura; Yoshimasa Nihei; Chuhei Oshima

A large-solid-angle electron energy analyzer (II)

Takeshi Nakajima^*, Daisuke Miura, Kenta Yamamura, Yoshimasa Nihei, Chuhei Oshima

^*この研究の対応する著者

早稲田大学

研究成果: Article › 査読

抄録

By limiting the entrance solid angle of the display-type analyzer, new wide solid-angle electron analyzer with the simple configuration was realized. This analyzer provides "angle-resolved" and "energy-resolved" electron pattern. By using CCD camera with MCP, we measured angle-resolved energy spectra. We show typical EELS spectra of ZrB₂ (0001) surface. The energy resolution and angle resolution were evaluated from the data. From LEED pattern of Si (111) - 7 × 7 surface, an angular resolution of 0.5° at the diffraction (00) spot was achieved (0.065 Å^-1 at 209 eV). Ratio of the energy width to the pass energy Δ/E₀ of the analyzer were 0.017-0.022 depending on the incidence angle.

本文言語	English
ページ（範囲）	2-6
ページ数	5
ジャーナル	Shinku/Journal of the Vacuum Society of Japan
巻	47
号	1
出版ステータス	Published - 2004

ASJC Scopus subject areas

電子工学および電気工学
表面および界面

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abstract = "By limiting the entrance solid angle of the display-type analyzer, new wide solid-angle electron analyzer with the simple configuration was realized. This analyzer provides {"}angle-resolved{"} and {"}energy-resolved{"} electron pattern. By using CCD camera with MCP, we measured angle-resolved energy spectra. We show typical EELS spectra of ZrB2 (0001) surface. The energy resolution and angle resolution were evaluated from the data. From LEED pattern of Si (111) - 7 × 7 surface, an angular resolution of 0.5° at the diffraction (00) spot was achieved (0.065 {\AA}-1 at 209 eV). Ratio of the energy width to the pass energy Δ/E0 of the analyzer were 0.017-0.022 depending on the incidence angle.",

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year = "2004",

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T1 - A large-solid-angle electron energy analyzer (II)

AU - Nakajima, Takeshi

AU - Miura, Daisuke

AU - Yamamura, Kenta

AU - Nihei, Yoshimasa

AU - Oshima, Chuhei

PY - 2004

Y1 - 2004

N2 - By limiting the entrance solid angle of the display-type analyzer, new wide solid-angle electron analyzer with the simple configuration was realized. This analyzer provides "angle-resolved" and "energy-resolved" electron pattern. By using CCD camera with MCP, we measured angle-resolved energy spectra. We show typical EELS spectra of ZrB2 (0001) surface. The energy resolution and angle resolution were evaluated from the data. From LEED pattern of Si (111) - 7 × 7 surface, an angular resolution of 0.5° at the diffraction (00) spot was achieved (0.065 Å-1 at 209 eV). Ratio of the energy width to the pass energy Δ/E0 of the analyzer were 0.017-0.022 depending on the incidence angle.

AB - By limiting the entrance solid angle of the display-type analyzer, new wide solid-angle electron analyzer with the simple configuration was realized. This analyzer provides "angle-resolved" and "energy-resolved" electron pattern. By using CCD camera with MCP, we measured angle-resolved energy spectra. We show typical EELS spectra of ZrB2 (0001) surface. The energy resolution and angle resolution were evaluated from the data. From LEED pattern of Si (111) - 7 × 7 surface, an angular resolution of 0.5° at the diffraction (00) spot was achieved (0.065 Å-1 at 209 eV). Ratio of the energy width to the pass energy Δ/E0 of the analyzer were 0.017-0.022 depending on the incidence angle.

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A large-solid-angle electron energy analyzer (II)

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