A large-solid-angle electron energy analyzer (II)

Takeshi Nakajima, Daisuke Miura, Kenta Yamamura, Yoshimasa Nihei, Chuhei Oshima

研究成果: Article

抜粋

By limiting the entrance solid angle of the display-type analyzer, new wide solid-angle electron analyzer with the simple configuration was realized. This analyzer provides "angle-resolved" and "energy-resolved" electron pattern. By using CCD camera with MCP, we measured angle-resolved energy spectra. We show typical EELS spectra of ZrB2 (0001) surface. The energy resolution and angle resolution were evaluated from the data. From LEED pattern of Si (111) - 7 × 7 surface, an angular resolution of 0.5° at the diffraction (00) spot was achieved (0.065 Å-1 at 209 eV). Ratio of the energy width to the pass energy Δ/E0 of the analyzer were 0.017-0.022 depending on the incidence angle.

元の言語English
ページ（範囲）2-6
ページ数5
ジャーナルShinku/Journal of the Vacuum Society of Japan
巻47
発行部数1
出版物ステータスPublished - 2004

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Surfaces and Interfaces

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    • これを引用

    Nakajima, T., Miura, D., Yamamura, K., Nihei, Y., & Oshima, C. (2004). A large-solid-angle electron energy analyzer (II). Shinku/Journal of the Vacuum Society of Japan, 47(1), 2-6.