A metric for measuring the abstraction level of design patterns

    研究成果: Conference contribution

    抄録

    The abstraction level of the problem treated by a design pattern has wide variety, from architecture to near implementation. There is no objective metric indicating the abstraction level of the problems addressed by patterns. Thus, it is difficult to understand the abstraction level of each pattern and to position a new pattern. In this paper, a metric is proposed. It indicates the relative abstraction level of a pattern's problem. We propose a metric obtained from inter-pattern relationships. We also propose a visualization method for the metric. Using such metrics, we aim to help developers easily understand the abstraction level of each pattern and, therefore, to better decide about its usefulness for the problem at hand.

    元の言語English
    ホスト出版物のタイトルACM International Conference Proceeding Series
    DOI
    出版物ステータスPublished - 2007
    イベント14th Conference on Pattern Languages of Programs, PLoP '07 - Monticello, IL
    継続期間: 2007 9 52007 9 8

    Other

    Other14th Conference on Pattern Languages of Programs, PLoP '07
    Monticello, IL
    期間07/9/507/9/8

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    ASJC Scopus subject areas

    • Human-Computer Interaction
    • Computer Networks and Communications
    • Computer Vision and Pattern Recognition
    • Software

    これを引用

    A metric for measuring the abstraction level of design patterns. / Kubo, Atsuto; Washizaki, Hironori; Fukazawa, Yoshiaki.

    ACM International Conference Proceeding Series. 2007. 1772093.

    研究成果: Conference contribution

    Kubo, A, Washizaki, H & Fukazawa, Y 2007, A metric for measuring the abstraction level of design patterns. : ACM International Conference Proceeding Series., 1772093, 14th Conference on Pattern Languages of Programs, PLoP '07, Monticello, IL, 07/9/5. https://doi.org/10.1145/1772070.1772093
    Kubo, Atsuto ; Washizaki, Hironori ; Fukazawa, Yoshiaki. / A metric for measuring the abstraction level of design patterns. ACM International Conference Proceeding Series. 2007.
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