A metric for measuring the abstraction level of design patterns

研究成果: Conference contribution

抜粋

The abstraction level of the problem treated by a design pattern has wide variety, from architecture to near implementation. There is no objective metric indicating the abstraction level of the problems addressed by patterns. Thus, it is difficult to understand the abstraction level of each pattern and to position a new pattern. In this paper, a metric is proposed. It indicates the relative abstraction level of a pattern's problem. We propose a metric obtained from inter-pattern relationships. We also propose a visualization method for the metric. Using such metrics, we aim to help developers easily understand the abstraction level of each pattern and, therefore, to better decide about its usefulness for the problem at hand.

元の言語English
ホスト出版物のタイトルPLoP07 - 14th Conference on Pattern Languages of Programs, Proceedings
DOI
出版物ステータスPublished - 2007 12 1
イベント14th Conference on Pattern Languages of Programs, PLoP '07 - Monticello, IL, United States
継続期間: 2007 9 52007 9 8

出版物シリーズ

名前ACM International Conference Proceeding Series

Conference

Conference14th Conference on Pattern Languages of Programs, PLoP '07
United States
Monticello, IL
期間07/9/507/9/8

ASJC Scopus subject areas

  • Software
  • Human-Computer Interaction
  • Computer Vision and Pattern Recognition
  • Computer Networks and Communications

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  • これを引用

    Kubo, A., Washizaki, H., & Fukazawa, Y. (2007). A metric for measuring the abstraction level of design patterns. : PLoP07 - 14th Conference on Pattern Languages of Programs, Proceedings [1772093] (ACM International Conference Proceeding Series). https://doi.org/10.1145/1772070.1772093