A metric for measuring the abstraction level of design patterns

Atsuto Kubo*, Hironori Washizaki, Yoshiaki Fukazawa

*この研究の対応する著者

研究成果: Conference contribution

抄録

The abstraction level of the problem treated by a design pattern has wide variety, from architecture to near implementation. There is no objective metric indicating the abstraction level of the problems addressed by patterns. Thus, it is difficult to understand the abstraction level of each pattern and to position a new pattern. In this paper, a metric is proposed. It indicates the relative abstraction level of a pattern's problem. We propose a metric obtained from inter-pattern relationships. We also propose a visualization method for the metric. Using such metrics, we aim to help developers easily understand the abstraction level of each pattern and, therefore, to better decide about its usefulness for the problem at hand.

本文言語English
ホスト出版物のタイトルPLoP07 - 14th Conference on Pattern Languages of Programs, Proceedings
DOI
出版ステータスPublished - 2007 12月 1
イベント14th Conference on Pattern Languages of Programs, PLoP '07 - Monticello, IL, United States
継続期間: 2007 9月 52007 9月 8

出版物シリーズ

名前ACM International Conference Proceeding Series

Conference

Conference14th Conference on Pattern Languages of Programs, PLoP '07
国/地域United States
CityMonticello, IL
Period07/9/507/9/8

ASJC Scopus subject areas

  • ソフトウェア
  • 人間とコンピュータの相互作用
  • コンピュータ ビジョンおよびパターン認識
  • コンピュータ ネットワークおよび通信

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