A new framework for constructing accurate affine invariant regions

Li Tian*, Sei Ichiro Kamata

*この研究の対応する著者

研究成果: Article査読

抄録

In this study, we propose a simple, yet general and powerful framework for constructing accurate affine invariant regions. In our framework, a method for extracting reliable seed points is first proposed. Then, regions which are invariant to most common affine transformations can be extracted from seed points by two new methods the Path Growing (PG) or the Thresholding Seeded Growing Region (TSGR). After that, an improved ellipse fitting method based on the Direct Least Square Fitting (DLSF) is used to fit the irregularly-shaped contours from the PG or the TSGR to obtain ellipse regions as the final invariant regions. In the experiments, our framework is first evaluated by the criterions of Mikolajczyk's evaluation framework [1], and then by near-duplicate detection problem [2]. Our framework shows its superiorities to the other detectors for different transformed images under Mikolajczyk's evaluation framework and the one with TSGR also gives satisfying results in the application to near-duplicate detection problem.

本文言語English
ページ(範囲)1831-1840
ページ数10
ジャーナルIEICE Transactions on Information and Systems
E90-D
11
DOI
出版ステータスPublished - 2007 11月

ASJC Scopus subject areas

  • ソフトウェア
  • ハードウェアとアーキテクチャ
  • コンピュータ ビジョンおよびパターン認識
  • 電子工学および電気工学
  • 人工知能

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