A new low power BIST methodology by altering the structure of linear feedback shift registers

Rui Li*, Chen Hu, Jun Yang, Zhe Zhang, Youhua Shi, Longxing Shi

*この研究の対応する著者

研究成果: Paper査読

6 被引用数 (Scopus)

抄録

In this paper a new low power BIST methodology by altering the structure of linear feedback shift register (LFSR) is proposed. In pseudo-random test mode, the efficiency of the vectors decreases sharply as the test progresses. For low power consumption during test mode, the proposed approach ignores the non-detecting vectors by altering the structure of LFSR. Note that altering the structure of LFSR is efficient, and its has no impact on the fault coverage.

本文言語English
ページ646-649
ページ数4
出版ステータスPublished - 2001
外部発表はい
イベント4th International Conference on ASIC Proceedings - Shanghai, China
継続期間: 2001 10月 232001 10月 25

Conference

Conference4th International Conference on ASIC Proceedings
国/地域China
CityShanghai
Period01/10/2301/10/25

ASJC Scopus subject areas

  • 工学(全般)

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