A novel approach for improving the quality of open fault diagnosis

Koji Yamazaki*, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume

*この研究の対応する著者

研究成果: Conference contribution

8 被引用数 (Scopus)

抄録

With the shrinking process technologies and the use of copper process, open defects on interconnect wires, contacts and vias often cause failure. Development of an efficient fault diagnosis method for open faults is desired. However, the diagnosis method for open faults has not been established yet. In this paper, we propose a novel approach for improving the diagnostic quality of open faults by introducing a threshold function in which the logical value of the line with open defect depends on the weighted logical values of its adjacent lines. By using the threshold function, we can deduce not only a faulty line but also an open defect site at the faulty line. Experimental results show that the proposed method can identify an exact faulty line in most cases with a very small computation cost. The proposed method can also identify the open defect site within 25%-length of the faulty line.

本文言語English
ホスト出版物のタイトルProceedings
ホスト出版物のサブタイトル22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems
ページ85-90
ページ数6
DOI
出版ステータスPublished - 2009
外部発表はい
イベント22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems - New Delhi, India
継続期間: 2009 1月 52009 1月 9

出版物シリーズ

名前Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems

Conference

Conference22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems
国/地域India
CityNew Delhi
Period09/1/509/1/9

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ
  • 制御およびシステム工学
  • 電子工学および電気工学

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