In this paper, we focus on pattern recognition based on the vector space model with the high dimensional and sparse data. One of the pattern recognition methods is metric learning which learns a metric matrix by using the iterative optimization procedure. However most of the metric learning methods tend to cause overfitting and increasing computational time for high dimensional and sparse settings. To avoid these problems, we propose the method of l1 regularized metric learning by using the algorithm of alternating direction method of multiplier (ADMM) in the supervised setting. The effectiveness of our proposed method is clarified by classification experiments by using the Japanese newspaper article and UCI machine learning repository. And we show proposed method is the special case of the statistical sparse covariance selection.