A study of capture-safe test generation flow for at-speed testing

Kohei Miyase*, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja

*この研究の対応する著者

研究成果: Article査読

抄録

Capture-safety, (defined as the avoidance of timing error due to unduly high launch switching activity in capture mode during at-speed scan testing), is critical in avoiding test induced yield loss. Although several sophisticated techniques are available for reducing capture IR-drop, there are few complete capture-safe test generation flows. This paper addresses the problem by proposing a novel and practical capture-safe test generation flow, featuring (1) a complete capture-safe test generation flow; (2) reliable capture-safety checking; and (3) effective capture-safety improvement by combining X-bit identification & X-filling with low launch-switching-activity test generation. The proposed flow minimizes test data inflation and is compatible with existing automatic test pattern generation (ATPG) flow. The techniques proposed in the flow achieve capture-safety without changing the circuit-under-test or the clocking scheme.

本文言語English
ページ(範囲)1309-1318
ページ数10
ジャーナルIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
E93-A
7
DOI
出版ステータスPublished - 2010 7月
外部発表はい

ASJC Scopus subject areas

  • 信号処理
  • コンピュータ グラフィックスおよびコンピュータ支援設計
  • 電子工学および電気工学
  • 応用数学

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