A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed

Lan Zhang, Atsushi Hosoi, Yang Ju

研究成果: Conference contribution

抜粋

Using the microwave atomic force microscope (M-AFM) measuring system, the sampleof Au nanowires arranged on glass wafer was sensed with three kinds of scanning speed. As theresults shown, the spatial resolution of topographies is increased with the decrease of scanningspeed. However, the precision of microwave images is not changed much with decreasing thescanning speed. Since M-AFM with the compact microwave instrument can always implement thereal time measurement, the variation of scanning speed will not affect the microwave measurement.

元の言語English
ホスト出版物のタイトルAdvanced Materials Science and Technology
出版者Trans Tech Publications Ltd
ページ200-203
ページ数4
ISBN(印刷物)9783037856604
DOI
出版物ステータスPublished - 2013 1 1
外部発表Yes
イベント8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 - Fukuoka City, Japan
継続期間: 2012 8 12012 8 4

出版物シリーズ

名前Materials Science Forum
750
ISSN(印刷物)0255-5476
ISSN(電子版)1662-9752

Conference

Conference8th International Forum on Advanced Materials Science and Technology, IFAMST 2012
Japan
Fukuoka City
期間12/8/112/8/4

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

フィンガープリント A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Zhang, L., Hosoi, A., & Ju, Y. (2013). A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed. : Advanced Materials Science and Technology (pp. 200-203). (Materials Science Forum; 巻数 750). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/MSF.750.200