A study on spatial resolution of the microwave atomic forcemicroscope imaging affected by scanning speed

Lan Zhang*, Atsushi Hosoi, Yang Ju

*この研究の対応する著者

研究成果: Conference contribution

抄録

Using the microwave atomic force microscope (M-AFM) measuring system, the sampleof Au nanowires arranged on glass wafer was sensed with three kinds of scanning speed. As theresults shown, the spatial resolution of topographies is increased with the decrease of scanningspeed. However, the precision of microwave images is not changed much with decreasing thescanning speed. Since M-AFM with the compact microwave instrument can always implement thereal time measurement, the variation of scanning speed will not affect the microwave measurement.

本文言語English
ホスト出版物のタイトルAdvanced Materials Science and Technology
出版社Trans Tech Publications Ltd
ページ200-203
ページ数4
ISBN(印刷版)9783037856604
DOI
出版ステータスPublished - 2013
外部発表はい
イベント8th International Forum on Advanced Materials Science and Technology, IFAMST 2012 - Fukuoka City, Japan
継続期間: 2012 8 12012 8 4

出版物シリーズ

名前Materials Science Forum
750
ISSN(印刷版)0255-5476
ISSN(電子版)1662-9752

Conference

Conference8th International Forum on Advanced Materials Science and Technology, IFAMST 2012
国/地域Japan
CityFukuoka City
Period12/8/112/8/4

ASJC Scopus subject areas

  • 材料科学(全般)
  • 凝縮系物理学
  • 材料力学
  • 機械工学

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