A VLSI scan-chain optimization algorithm for multiple scan-paths

Susumu Kobayashi*, Masato Edahiro, Mikio Kubo


研究成果: Article査読

10 被引用数 (Scopus)


This paper presents an algorithm for the scanchain optimization problem in multiple-scan design methodology. The proposed algorithm which consists of four phases first determines pairs of scan-in and scan-out pins (Phase 1) and then assigns flip-flops to scan-paths by using a graph theoretical method (Phase 2). Next the algorithm decides connection-order of flipflops in each scan-path by using TSP (Traveling Salesman Problem) heuristics (Phase 3) and finally exchanges flip-flops among scan-paths in order to reduce total scan-path length (Phase 4). Experiments using actual design data show that for ten scanpaths our algorithm achieved a 90% reduction in scan-test time at the expense of a 7% total scan-path length increase as compared with the length of a single optimized scan-path. Also our algorithm produced less total scan-path length than other three possible algorithms in a reasonable computing time.

ジャーナルIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
出版ステータスPublished - 1999

ASJC Scopus subject areas

  • 信号処理
  • コンピュータ グラフィックスおよびコンピュータ支援設計
  • 電子工学および電気工学
  • 応用数学


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