ACCELERATED LASER-SPECKLE STRAIN GAUGE.

Ichirou Yamaguchi, Takeo Furukawa, Toshitsugu Ueda, Eiji Ogita

研究成果: Conference contribution

抄録

An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser illuminated object is detected in real time using new photodetectors in place of linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning facility, produces a voltage directly proportional to speckle displacement. Therefore, this strain gauge, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few mV/microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of Hz and were able to evaluate their Poisson's ratios.

本文言語English
ホスト出版物のタイトルProceedings of SPIE - The International Society for Optical Engineering
編集者Henri H. Arsenault
Place of PublicationBellingham, WA, USA
出版社SPIE
ページ132-138
ページ数7
556
ISBN(印刷版)0892525916
出版ステータスPublished - 1985
外部発表はい

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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