抄録
An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser illuminated object is detected in real time using new photodetectors in place of linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning facility, produces a voltage directly proportional to speckle displacement. Therefore, this strain gauge, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few mV/microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of Hz and were able to evaluate their Poisson's ratios.
本文言語 | English |
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ホスト出版物のタイトル | Proceedings of SPIE - The International Society for Optical Engineering |
編集者 | Henri H. Arsenault |
Place of Publication | Bellingham, WA, USA |
出版社 | SPIE |
ページ | 132-138 |
ページ数 | 7 |
巻 | 556 |
ISBN(印刷版) | 0892525916 |
出版ステータス | Published - 1985 |
外部発表 | はい |
ASJC Scopus subject areas
- 電子工学および電気工学
- 凝縮系物理学