抄録
An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser illuminated object is detected in real time using new photodetectors in place of linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning facility, produces a voltage directly proportional to speckle displacement. Therefore, this strain gauge, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few mV/microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of Hz and were able to evaluate their Poisson's ratios.
| 本文言語 | English |
|---|---|
| ホスト出版物のタイトル | Proceedings of SPIE - The International Society for Optical Engineering |
| 編集者 | Henri H. Arsenault |
| Place of Publication | Bellingham, WA, USA |
| 出版社 | SPIE |
| ページ | 132-138 |
| ページ数 | 7 |
| 巻 | 556 |
| ISBN（印刷版） | 0892525916 |
| 出版ステータス | Published - 1985 |
| 外部発表 | はい |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics