TY - GEN
T1 - Acquiring curvature-dependent reflectance function from translucent material
AU - Okamoto, Midori
AU - Kubo, Hiroyuki
AU - Mukaigawa, Yasuhiro
AU - Ozawa, Tadahiro
AU - Mochida, Keisuke
AU - Morishima, Shigeo
PY - 2016/9/9
Y1 - 2016/9/9
N2 - Acquiring scattering parameters from real objects is still a challenging work. To obtain the scattering parameters, physics-based analysis is ineffective because huge computational cost is required to simulate subsurface scattering effect accurately. Thus, we focus on Curvature-Dependent Reflectance Function (CDRF), the plausible approximation of the subsurface scattering effect. In this paper, we propose a novel technique to obtain scattering parameters from real objects by revealing the relation between curvature and translucency.
AB - Acquiring scattering parameters from real objects is still a challenging work. To obtain the scattering parameters, physics-based analysis is ineffective because huge computational cost is required to simulate subsurface scattering effect accurately. Thus, we focus on Curvature-Dependent Reflectance Function (CDRF), the plausible approximation of the subsurface scattering effect. In this paper, we propose a novel technique to obtain scattering parameters from real objects by revealing the relation between curvature and translucency.
KW - BRDF
KW - Curvature
KW - Inverse rendering
KW - Subsurface scattering
UR - http://www.scopus.com/inward/record.url?scp=84991109226&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84991109226&partnerID=8YFLogxK
U2 - 10.1109/NicoInt.2016.52
DO - 10.1109/NicoInt.2016.52
M3 - Conference contribution
AN - SCOPUS:84991109226
T3 - Proceedings - NICOGRAPH International 2016, NicoInt 2016
SP - 182
EP - 185
BT - Proceedings - NICOGRAPH International 2016, NicoInt 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 15th NICOGRAPH International, NicoInt 2016
Y2 - 6 July 2016 through 8 July 2016
ER -