Aging mechanism of silicone rubber by heat and gamma-rays

Yoshimichi Ohki, Shugo Hanada, Maki Miyamoto, Naoshi Hirai, Liuqing Yang

研究成果: Conference contribution

6 引用 (Scopus)

抜粋

The aging mechanism of silicone rubber, which is important for electrical insulation of cables, is examined from many aspects such as instrumental, chemical, electrical, and mechanical analyses. As a result, it has become clear that silicone rubber degrades by forming crosslinked structures via the formation of abundant siloxane bonds.

元の言語English
ホスト出版物のタイトル2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016
出版者Institute of Electrical and Electronics Engineers Inc.
ページ869-872
ページ数4
2016-December
ISBN(電子版)9781509046546
DOI
出版物ステータスPublished - 2016 12 15
イベント2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016 - Toronto, Canada
継続期間: 2016 10 162016 10 19

Other

Other2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016
Canada
Toronto
期間16/10/1616/10/19

    フィンガープリント

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

これを引用

Ohki, Y., Hanada, S., Miyamoto, M., Hirai, N., & Yang, L. (2016). Aging mechanism of silicone rubber by heat and gamma-rays. : 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016 (巻 2016-December, pp. 869-872). [7785487] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CEIDP.2016.7785487