抄録
The aging mechanism of silicone rubber, which is important for electrical insulation of cables, is examined from many aspects such as instrumental, chemical, electrical, and mechanical analyses. As a result, it has become clear that silicone rubber degrades by forming crosslinked structures via the formation of abundant siloxane bonds.
本文言語 | English |
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ホスト出版物のタイトル | 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016 |
出版社 | Institute of Electrical and Electronics Engineers Inc. |
ページ | 869-872 |
ページ数 | 4 |
巻 | 2016-December |
ISBN(電子版) | 9781509046546 |
DOI | |
出版ステータス | Published - 2016 12月 15 |
イベント | 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016 - Toronto, Canada 継続期間: 2016 10月 16 → 2016 10月 19 |
Other
Other | 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016 |
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国/地域 | Canada |
City | Toronto |
Period | 16/10/16 → 16/10/19 |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 電子工学および電気工学