Alternative run-length coding through scan chain reconfiguration for joint minimization of test data volume and power consumption in scan test

研究成果: Conference contribution

2 引用 (Scopus)

抜粋

Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce both test data volume and scan-in power consumption. The proposed method analyzes the compatibility of the internal scan cells for a given test set and then divides the scan cells into compatible classes. To extract the compatible scan cells we apply a heuristic algorithm by solving the graph coloring problem; and then a simple greedy algorithm is used to configure the scan chain for the minimization of scan power. Experimental results for the larger IS-CAS'89 benchmarks show that the proposed approach leads to highly reduced test data volume with significant power savings during scan test.

元の言語English
ホスト出版物のタイトルProceedings of the Asian Test Symposium, ATS'04
ページ432-437
ページ数6
DOI
出版物ステータスPublished - 2004 12 1
イベントProceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan, Province of China
継続期間: 2004 11 152004 11 17

出版物シリーズ

名前Proceedings of the Asian Test Symposium
ISSN(印刷物)1081-7735

Conference

ConferenceProceedings of the Asian Test Symposium, ATS'04
Taiwan, Province of China
Kenting
期間04/11/1504/11/17

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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