An artificial fingerprint device (AFD): A study of identification number applications utilizing characteristics variation of polycrystalline silicon TFTs

Shigenobu Maeda*, Hirotada Kuriyama, Takashi Ipposhi, Shigeto Maegawa, Yasuo Inoue, Masahide Inuishi, Norihiko Kotani, Tadashi Nishimura

*この研究の対応する著者

研究成果: Article査読

21 被引用数 (Scopus)

抄録

An idea for obtaining unique identification (ID) numbers using polycrystalline silicon (poly-Si) thin-film transistors (TFTs) with a logic LSI compatible process is proposed. Like an actual human fingerprint, the characteristic variations of poly-Si TFTs are utilized for ID numbers in LSIs. The variation of poly-Si TFT characteristics is random, and this method offers unique, nonalterable, and nonduplicable numbers without any special processes, unlike other methods such as flash memory and mask ROM. These characteristics are highly suitable for ID number applications. The device physics of poly-Si TFTs for realizing the stable recognition of ID numbers was studied and a recognition circuit is proposed. The design guidelines for the grain size of poly-Si and AFD applications are also discussed.

本文言語English
ページ(範囲)1451-1458
ページ数8
ジャーナルIEEE Transactions on Electron Devices
50
6
DOI
出版ステータスPublished - 2003 6
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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