An improved method for lifetime prediction based on decoupling of the joule self-heating effect from coulombic degradation in accelerated aging tests of OLEDs

Toshihiro Yoshioka, Kazunori Sugimoto, Kyoko Katagi, Yoshiyuki Kitago, Masaru Tajima, Satoshi Miyaguchi, Tetsuo Tsutsui, Ryota Iwasaki, Yukio Furukawa

    研究成果: Chapter

    5 引用 (Scopus)

    抄録

    We successfully improved the prediction accuracy of the driving lifetime in organic light emitting diodes based on numerical fitting of the luminous degradation curves and the decoupling of the self-heating effect from coulombic effects. Model phosphorescent multilayer OLEDs with CBP:Ir(ppy) 3 emission layers are used.

    元の言語English
    ホスト出版物のタイトルDigest of Technical Papers - SID International Symposium
    出版者Blackwell Publishing Ltd
    ページ642-645
    ページ数4
    45
    エディション1
    DOI
    出版物ステータスPublished - 2014

    Fingerprint

    Organic light emitting diodes (OLED)
    Aging of materials
    Heating
    Degradation
    Multilayers

    ASJC Scopus subject areas

    • Engineering(all)

    これを引用

    Yoshioka, T., Sugimoto, K., Katagi, K., Kitago, Y., Tajima, M., Miyaguchi, S., ... Furukawa, Y. (2014). An improved method for lifetime prediction based on decoupling of the joule self-heating effect from coulombic degradation in accelerated aging tests of OLEDs. : Digest of Technical Papers - SID International Symposium (1 版, 巻 45, pp. 642-645). Blackwell Publishing Ltd. https://doi.org/10.1002/j.2168-0159.2014.tb00168.x

    An improved method for lifetime prediction based on decoupling of the joule self-heating effect from coulombic degradation in accelerated aging tests of OLEDs. / Yoshioka, Toshihiro; Sugimoto, Kazunori; Katagi, Kyoko; Kitago, Yoshiyuki; Tajima, Masaru; Miyaguchi, Satoshi; Tsutsui, Tetsuo; Iwasaki, Ryota; Furukawa, Yukio.

    Digest of Technical Papers - SID International Symposium. 巻 45 1. 編 Blackwell Publishing Ltd, 2014. p. 642-645.

    研究成果: Chapter

    Yoshioka, T, Sugimoto, K, Katagi, K, Kitago, Y, Tajima, M, Miyaguchi, S, Tsutsui, T, Iwasaki, R & Furukawa, Y 2014, An improved method for lifetime prediction based on decoupling of the joule self-heating effect from coulombic degradation in accelerated aging tests of OLEDs. : Digest of Technical Papers - SID International Symposium. 1 Edn, 巻. 45, Blackwell Publishing Ltd, pp. 642-645. https://doi.org/10.1002/j.2168-0159.2014.tb00168.x
    Yoshioka T, Sugimoto K, Katagi K, Kitago Y, Tajima M, Miyaguchi S その他. An improved method for lifetime prediction based on decoupling of the joule self-heating effect from coulombic degradation in accelerated aging tests of OLEDs. : Digest of Technical Papers - SID International Symposium. 1 版 巻 45. Blackwell Publishing Ltd. 2014. p. 642-645 https://doi.org/10.1002/j.2168-0159.2014.tb00168.x
    Yoshioka, Toshihiro ; Sugimoto, Kazunori ; Katagi, Kyoko ; Kitago, Yoshiyuki ; Tajima, Masaru ; Miyaguchi, Satoshi ; Tsutsui, Tetsuo ; Iwasaki, Ryota ; Furukawa, Yukio. / An improved method for lifetime prediction based on decoupling of the joule self-heating effect from coulombic degradation in accelerated aging tests of OLEDs. Digest of Technical Papers - SID International Symposium. 巻 45 1. 版 Blackwell Publishing Ltd, 2014. pp. 642-645
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    AU - Yoshioka, Toshihiro

    AU - Sugimoto, Kazunori

    AU - Katagi, Kyoko

    AU - Kitago, Yoshiyuki

    AU - Tajima, Masaru

    AU - Miyaguchi, Satoshi

    AU - Tsutsui, Tetsuo

    AU - Iwasaki, Ryota

    AU - Furukawa, Yukio

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