Analysis and reduction of SRAM PUF Bit Error Rate

Hirofumi Shinohara, Baikun Zheng, Yanhao Piao, Bo Liu, Shiyu Liu

研究成果: Conference contribution

5 被引用数 (Scopus)

抄録

Reducing BER (Bit Error Rate) is a crucial problem for a PUF (Physical Unclonable Function) in the security application. In this paper, BER is analyzed focusing on two major factors: mismatch factor and noise. By comparing five SRAM PUFs with different transistor sizes, weight factor of load pMOS and driver nMOS that determines the mismatch is extracted. And it is shown that BER can be reduced by unbalancing the pMOS/nMOS transistor size ratio.

本文言語English
ホスト出版物のタイトル2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017
出版社Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9781509039692
DOI
出版ステータスPublished - 2017 6 5
イベント2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017 - Hsinchu, Taiwan, Province of China
継続期間: 2017 4 242017 4 27

Other

Other2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017
国/地域Taiwan, Province of China
CityHsinchu
Period17/4/2417/4/27

ASJC Scopus subject areas

  • 電子工学および電気工学
  • 安全性、リスク、信頼性、品質管理

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