Analysis of polymer double-reflection waveguide-type Kretschmann-structure surface plasmon resonance sensor for high-sensitive and wide-measurable range

H. Tansho, Y. Kuroda, Hiroshi Ishikawa, Yuichi Matsushima, Katsuyuki Utaka

    研究成果: Conference contribution

    抄録

    We have proposed the new waveguide-type Kretschmann-structure surface plasmon resonance sensor employing two incident-angled structures which gives slightly different characteristics for high-sensitive and wide-measurable range.

    本文言語English
    ホスト出版物のタイトルMOC 2015 - Technical Digest of 20th Microoptics Conference
    出版社Institute of Electrical and Electronics Engineers Inc.
    ISBN(電子版)9784863485433
    DOI
    出版ステータスPublished - 2016 2 23
    イベント20th Microoptics Conference, MOC 2015 - Fukuoka, Japan
    継続期間: 2015 10 252015 10 28

    Other

    Other20th Microoptics Conference, MOC 2015
    国/地域Japan
    CityFukuoka
    Period15/10/2515/10/28

    ASJC Scopus subject areas

    • 原子分子物理学および光学
    • 電子材料、光学材料、および磁性材料

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