Anomalous Rashba effect of bismuth(111) thin films studied by high-resolution spin- and angle-resolved photoemission spectroscopy

Akari Takayama*, Takafumi Sato, Seigo Souma, Takashi Takahashi

*この研究の対応する著者

研究成果: Article査読

3 被引用数 (Scopus)

抄録

The authors have developed an ultrahigh-resolution spin-resolved photoemission spectrometer equipped with a highly efficient mini Mott detector and a high-intensity xenon plasma discharge lamp. An electron deflector situated between the hemispherical electron-energy analyzer and the Mott detector enables the determination of the electron's spin-polarization in three independent directions and the spectrometer achieves an energy resolution of 0.9 and 8 meV for nonspin-resolved and spin-resolved modes, respectively. By using this spectrometer, we have performed spin- and angle-resolved photoemission spectroscopy of bismuth thin films on Si(111) to investigate the spin structure of surface states. Unlike conventional Rashba splitting, the magnitude of the in-plane spin polarization is asymmetric across the zone center between the two elongated surface hole pockets and there is a giant out-of-plane spin polarization. The authors discuss these unusual spin textures in terms of a possible time-reversal symmetry breaking.

本文言語English
論文番号04E107
ジャーナルJournal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
30
4
DOI
出版ステータスPublished - 2012 7
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 器械工学
  • プロセス化学およびプロセス工学
  • 表面、皮膜および薄膜
  • 電子工学および電気工学
  • 材料化学

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