The authors have developed an ultrahigh-resolution spin-resolved photoemission spectrometer equipped with a highly efficient mini Mott detector and a high-intensity xenon plasma discharge lamp. An electron deflector situated between the hemispherical electron-energy analyzer and the Mott detector enables the determination of the electron's spin-polarization in three independent directions and the spectrometer achieves an energy resolution of 0.9 and 8 meV for nonspin-resolved and spin-resolved modes, respectively. By using this spectrometer, we have performed spin- and angle-resolved photoemission spectroscopy of bismuth thin films on Si(111) to investigate the spin structure of surface states. Unlike conventional Rashba splitting, the magnitude of the in-plane spin polarization is asymmetric across the zone center between the two elongated surface hole pockets and there is a giant out-of-plane spin polarization. The authors discuss these unusual spin textures in terms of a possible time-reversal symmetry breaking.
|ジャーナル||Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics|
|出版ステータス||Published - 2012 7月|
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