AutoPUT: An automated technique for retrofitting closed unit tests into parameterized unit tests

Keita Tsukamoto, Yuta Maezawa, Shinichi Honiden

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

Parameterized unit testing is a promising technique for developers to use to facilitate the understanding of test codes. However, as a practical issue, developers might not have sufficient resources to implement parameterized unit tests (PUTs) corresponding to a vast number of closed unit tests (CUTs) in long-term software projects. Although a technique for retrofitting CUTs into PUTs was proposed, it imposes a laborious task on developers to promote parameters in CUTs. In this study, we propose a fully automated CUT-PUT retrofitting technique (called AutoPUT), which detects similar CUTs as PUT candidates by comparing their code structures. It then identifies common procedures and unique parameters to generate PUTs without degradation in terms of code coverage as compared with original CUTs. From the results of our case-study experiments on open-sourced software projects, we found that AutoPUT fully automatically generated 204 PUTs in 8.5 hours. We concluded that AutoPUT can help developers maintain test suites for building reliable software.

本文言語English
ホスト出版物のタイトルProceedings of the 33rd Annual ACM Symposium on Applied Computing, SAC 2018
出版社Association for Computing Machinery
ページ1944-1951
ページ数8
ISBN(電子版)9781450351911
DOI
出版ステータスPublished - 2018 4月 9
外部発表はい
イベント33rd Annual ACM Symposium on Applied Computing, SAC 2018 - Pau, France
継続期間: 2018 4月 92018 4月 13

出版物シリーズ

名前Proceedings of the ACM Symposium on Applied Computing

Other

Other33rd Annual ACM Symposium on Applied Computing, SAC 2018
国/地域France
CityPau
Period18/4/918/4/13

ASJC Scopus subject areas

  • ソフトウェア

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