Backscattering correction for quantitative Auger analysis. II. Verifications of the backscattering factors through quantification by AES

S. Ichimura, R. Shimizu, T. Ikuta

研究成果: Article査読

45 被引用数 (Scopus)

抄録

The validity and utility of the backscattering correction factors obtained from Monte Carlo calculations for quantitative analysis by Auger electron spectroscopy (AES) were examined through practical quantification of surface concentrations of binary alloys. Quantifications were attempted, first, to access the surface composition of a sputter-deposited NiPt layer, which is probably the most appropriate test-sample with known surface composition for surface analysis. The quantification by AES has led to the result that the surface composition of the layer agrees well with the bulk composition of the sputtered NiPt alloy, as expected. The composition of a sputtered AuCu alloy surface was, then, examined according to the same correction procedure as for the NiPt layer, leading to the confirmation that no preferential sputtering is observed for AuCu alloys by AES as Färber et al. reported.

本文言語English
ページ(範囲)259-269
ページ数11
ジャーナルSurface Science
115
2
DOI
出版ステータスPublished - 1982 3 1
外部発表はい

ASJC Scopus subject areas

  • 凝縮系物理学
  • 表面および界面
  • 表面、皮膜および薄膜
  • 材料化学

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