Backscattering correction for quantitative Auger analysis III. A simple functional representation of electron backscattering factors

S. Ichimura; R. Shimizu; J. P. Langeron

doi:10.1016/0039-6028(83)90791-4

Backscattering correction for quantitative Auger analysis III. A simple functional representation of electron backscattering factors

S. Ichimura^*, R. Shimizu, J. P. Langeron

^*この研究の対応する著者

研究成果: Article › 査読

102 被引用数 (Scopus)

抄録

Backscattering factors for quantitative Auger analysis which were obtained by Monte Carlo calculations were analytically represented by using simple functions. This should enable the backscattering correction procedure in quantitative Auger analysis to be of more practical use.

本文言語	English
ページ（範囲）	L49-L54
ジャーナル	Surface Science
巻	124
号	2-3
DOI	https://doi.org/10.1016/0039-6028(83)90791-4
出版ステータス	Published - 1983 1月 2
外部発表	はい

ASJC Scopus subject areas

凝縮系物理学
表面および界面
表面、皮膜および薄膜
材料化学

文献へのアクセス

10.1016/0039-6028(83)90791-4

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引用スタイル

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