抜粋
Backscattering factors for quantitative Auger analysis which were obtained by Monte Carlo calculations were analytically represented by using simple functions. This should enable the backscattering correction procedure in quantitative Auger analysis to be of more practical use.
| 元の言語 | English |
|---|---|
| ページ（範囲） | L49-L54 |
| ジャーナル | Surface Science |
| 巻 | 124 |
| 発行部数 | 2-3 |
| DOI | |
| 出版物ステータス | Published - 1983 1 2 |
| 外部発表 | Yes |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry
フィンガープリント Backscattering correction for quantitative Auger analysis III. A simple functional representation of electron backscattering factors' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。
これを引用
Ichimura, S., Shimizu, R., & Langeron, J. P. (1983). Backscattering correction for quantitative Auger analysis III. A simple functional representation of electron backscattering factors. Surface Science, 124(2-3), L49-L54. https://doi.org/10.1016/0039-6028(83)90791-4