抄録
We investigated a role of a Schottky barrier (SB) in carrier doped random-network single-walled carbon nanotube field effect transistors (RN-SWNT-FETs) and the precise estimation of the SB height by a suitable combination of the gate and source-drain voltages. The SB heights were 70 meV for hole and 100 meV for electron in p- and n-type FETs, respectively. Furthermore, the barrier height was able to be modulated by changing the doping level, which indicates the possibility of controlling the characteristics of RN-SWNT-FETs.
本文言語 | English |
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論文番号 | 013112 |
ジャーナル | Applied Physics Letters |
巻 | 89 |
号 | 1 |
DOI | |
出版ステータス | Published - 2006 |
外部発表 | はい |
ASJC Scopus subject areas
- 物理学および天文学(その他)