Basic studies on X-ray uorescence analysis for active X-ray spectrometer on SELENE-2

Hiroki Kusano*, Nobuyuki Hasebe, Hiroshi Nagaoka, Takuro Kodama, Yuki Oyama, Reiko Tanaka, Yoshiharu Amano, Kyeong J. Kim, Jose A. Matias Lopes

*この研究の対応する著者

研究成果: Conference contribution

3 被引用数 (Scopus)

抄録

An active X-ray spectrometer (AXS) is now being developed as a payload candidate for the rover on SELENE-2, the next Japanese lunar exploration mission. The AXS will determine the chemical compositions of lunar rocks and regolith around the landing site. The surface of lunar rock samples will be ground using a rock abrasion tool. Thus, fundamental studies on the X-ray fluorescence analysis for lunar rocks and regolith are required to design and develop the AXS. In this study, we have investigated the X-ray fluorescence analysis in order to evaluate the effects of surface roughness of samples and the angle of incident and emergent X-rays. It was found that the fluorescent X-ray yield for low energy X-rays, i.e. the light elements, decreases at rough surface samples. This effect of surface roughness becomes small for smooth surface samples. It was also found that the fluorescent X-ray yield depends on the incident angle, which is attributed to the fact that the X-ray fluorescence occurs closer to the sample surface at larger incident angles. Since the emergent X-rays are affected by the detection geometry and surface roughness, the incident angle effect also depends on the above conditions.

本文言語English
ホスト出版物のタイトルHard X-Ray, Gamma-Ray, and Neutron Detector Physics XV
DOI
出版ステータスPublished - 2013 11 8
イベントSPIE Conference on Hard X-Ray, Gamma-Ray and Neutron Detector Physics XV - San Diego, CA, United States
継続期間: 2013 8 262013 8 28

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
8852
ISSN(印刷版)0277-786X
ISSN(電子版)1996-756X

Conference

ConferenceSPIE Conference on Hard X-Ray, Gamma-Ray and Neutron Detector Physics XV
国/地域United States
CitySan Diego, CA
Period13/8/2613/8/28

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

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