Biaxially aligned yttria-stabilized zirconia (YSZ) films on Ni-based alloy substrates were realized with high deposition rate of 0.5 μm min-1 by the inclined substrate deposition (ISD) technique without ion beam assistance. The microstructure of YSZ was examined to study the growth mechanism of biaxial alignment by ISD. Columnar structures toward the plasma plume suggested a self-shadowing effect in the ISD process. To raise Ic values, YBCO thickness was increased up to 5 μm. Thick YBCO films with high Jc values were realized on the ISD-grown YSZ. Long YBCO tapes with biaxial alignment were successfully fabricated using continuous pulsed laser deposition and a high Ic value of 37.0 A (77.3 K, 0 T) at a 75 cm voltage tap spacing was achieved.
ASJC Scopus subject areas