Bit Error Rate Performance of Bias-Free Operational UTC-PD for High Baud Rate Communications up to 100 Gbaud

T. Umezawa, A. Matsumoto, A. Kanno, N. Yamamoto, Tetsuya Kawanishi

研究成果: Conference contribution

抄録

We fabricated a bias free operational high bandwidth photodetector operated over 110-GHz, and characterized the bit error performance at up to 100-Gbaud. At 90-Gbaud, text{BER} < 1times 10-{-3} was confirmed without a frequency equalizer or a DSP.

元の言語English
ホスト出版物のタイトル2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings
出版者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9781943580576
DOI
出版物ステータスPublished - 2019 5 1
イベント2019 Conference on Lasers and Electro-Optics, CLEO 2019 - San Jose, United States
継続期間: 2019 5 52019 5 10

出版物シリーズ

名前2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings

Conference

Conference2019 Conference on Lasers and Electro-Optics, CLEO 2019
United States
San Jose
期間19/5/519/5/10

Fingerprint

Equalizers
bit error rate
Photodetectors
Bit error rate
photometers
communication
bandwidth
Bandwidth
Communication
rate

ASJC Scopus subject areas

  • Spectroscopy
  • Industrial and Manufacturing Engineering
  • Safety, Risk, Reliability and Quality
  • Management, Monitoring, Policy and Law
  • Electronic, Optical and Magnetic Materials
  • Radiology Nuclear Medicine and imaging
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

これを引用

Umezawa, T., Matsumoto, A., Kanno, A., Yamamoto, N., & Kawanishi, T. (2019). Bit Error Rate Performance of Bias-Free Operational UTC-PD for High Baud Rate Communications up to 100 Gbaud. : 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings [8750032] (2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/CLEO.2019.8750032

Bit Error Rate Performance of Bias-Free Operational UTC-PD for High Baud Rate Communications up to 100 Gbaud. / Umezawa, T.; Matsumoto, A.; Kanno, A.; Yamamoto, N.; Kawanishi, Tetsuya.

2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. 8750032 (2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings).

研究成果: Conference contribution

Umezawa, T, Matsumoto, A, Kanno, A, Yamamoto, N & Kawanishi, T 2019, Bit Error Rate Performance of Bias-Free Operational UTC-PD for High Baud Rate Communications up to 100 Gbaud. : 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings., 8750032, 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2019 Conference on Lasers and Electro-Optics, CLEO 2019, San Jose, United States, 19/5/5. https://doi.org/10.23919/CLEO.2019.8750032
Umezawa T, Matsumoto A, Kanno A, Yamamoto N, Kawanishi T. Bit Error Rate Performance of Bias-Free Operational UTC-PD for High Baud Rate Communications up to 100 Gbaud. : 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2019. 8750032. (2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings). https://doi.org/10.23919/CLEO.2019.8750032
Umezawa, T. ; Matsumoto, A. ; Kanno, A. ; Yamamoto, N. ; Kawanishi, Tetsuya. / Bit Error Rate Performance of Bias-Free Operational UTC-PD for High Baud Rate Communications up to 100 Gbaud. 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. (2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings).
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