| 元の言語 | English |
|---|---|
| ホスト出版物のタイトル | 2006 IEEE Sarnoff Symposium |
| DOI | |
| 出版物ステータス | Published - 2006 |
| イベント | 2006 IEEE Sarnoff Symposium - Princeton, NJ 継続期間: 2006 3 27 → 2006 3 28 |
Other
| Other | 2006 IEEE Sarnoff Symposium |
|---|---|
| 市 | Princeton, NJ |
| 期間 | 06/3/27 → 06/3/28 |
ASJC Scopus subject areas
- Computer Networks and Communications
- Electrical and Electronic Engineering
- Communication
これを引用
Shah, A. M., Ara, S. S., & Matsumoto, M. (2006). Block selective repeat: A new ARQ scheme for high speed IrDA links. ： 2006 IEEE Sarnoff Symposium [4534782] https://doi.org/10.1109/SARNOF.2006.4534782
Block selective repeat : A new ARQ scheme for high speed IrDA links. / Shah, Alam Mohammad; Ara, Shawkat Shamim; Matsumoto, Mitsuji.
2006 IEEE Sarnoff Symposium. 2006. 4534782.研究成果: Conference contribution
Shah, AM, Ara, SS & Matsumoto, M 2006, Block selective repeat: A new ARQ scheme for high speed IrDA links. ： 2006 IEEE Sarnoff Symposium., 4534782, 2006 IEEE Sarnoff Symposium, Princeton, NJ, 06/3/27. https://doi.org/10.1109/SARNOF.2006.4534782
Shah AM, Ara SS, Matsumoto M. Block selective repeat: A new ARQ scheme for high speed IrDA links. ： 2006 IEEE Sarnoff Symposium. 2006. 4534782 https://doi.org/10.1109/SARNOF.2006.4534782
@inproceedings{d4940a6018ce4f0b82a13d37be4b0787,
title = "Block selective repeat: A new ARQ scheme for high speed IrDA links",
author = "Shah, {Alam Mohammad} and Ara, {Shawkat Shamim} and Mitsuji Matsumoto",
year = "2006",
doi = "10.1109/SARNOF.2006.4534782",
language = "English",
isbn = "1424400023",
booktitle = "2006 IEEE Sarnoff Symposium",
}
TY - GEN
T1 - Block selective repeat
T2 - A new ARQ scheme for high speed IrDA links
AU - Shah, Alam Mohammad
AU - Ara, Shawkat Shamim
AU - Matsumoto, Mitsuji
PY - 2006
Y1 - 2006
UR - http://www.scopus.com/inward/record.url?scp=50649085032&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=50649085032&partnerID=8YFLogxK
U2 - 10.1109/SARNOF.2006.4534782
DO - 10.1109/SARNOF.2006.4534782
M3 - Conference contribution
SN - 1424400023
SN - 9781424400027
BT - 2006 IEEE Sarnoff Symposium
ER -