Causal transmission line model incorporating frequency-dependent linear resistors

Atsushi Takeshige, Yuji Ito, Kyoya Takano, Kosuke Katayama, Takeshi Yoshida, Minoru Fujishima, Shuhei Amakawa

研究成果: Conference contribution

2 被引用数 (Scopus)

抄録

An empirical transmission line (TL) model is proposed that incorporates frequency-dependent linear resistors. The use of such resistors allows experimentally observed characteristics of TLs (frequency dependence of dielectric losses, especially) to be better reproduced compared to models built only of ordinary frequency-independent RLCs. All components of the model, including frequency-dependent resistors, have well-defined time-domain responses and therefore the model is causal. The proposed model fits and reproduces the measured characteristics of TLs fabricated using a 65-nm CMOS process well in the frequency range from 0.5 to 330 GHz.

本文言語English
ホスト出版物のタイトル2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings
出版社Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9781509056163
DOI
出版ステータスPublished - 2017 6 7
外部発表はい
イベント21st IEEE Workshop on Signal and Power Integrity, SPI 2017 - Lake Maggiore (Baveno), Italy
継続期間: 2017 5 72017 5 10

出版物シリーズ

名前2017 IEEE 21st Workshop on Signal and Power Integrity, SPI 2017 - Proceedings

Other

Other21st IEEE Workshop on Signal and Power Integrity, SPI 2017
国/地域Italy
CityLake Maggiore (Baveno)
Period17/5/717/5/10

ASJC Scopus subject areas

  • コンピュータ ネットワークおよび通信
  • ハードウェアとアーキテクチャ
  • 信号処理

フィンガープリント

「Causal transmission line model incorporating frequency-dependent linear resistors」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル