Characterization of locally modified diamond surface using Kelvin probe force microscope

Minoru Tachiki, Yu Kaibara, Yu Sumikawa, Masatsugu Shigeno, Hirohumi Kanazawa, Tokishige Banno, Kwang Soup Song, Hitoshi Umezawa, Hiroshi Kawarada

研究成果: Article

44 引用 (Scopus)

抜粋

The surface potential difference between an H-terminated surface and a locally oxidized diamond surface produced by an atomic force microprobe was investigated using a Kelvin probe force microscope. The potential of the H-terminated diamond surface was observed to be ∼0.1 V higher than that of the oxidized diamond surface. The surface potential difference can be interpreted in terms of the positions of the vacuum level, the Fermi level, and the conduction and valence band edges, when negative electron affinity and p-type surface conduction are assumed on the H-terminated diamond surface. The surface dipole induced by the electronegativity differences between the surface atoms of the diamond affects the difference in the surface potential between the two surfaces.

元の言語English
ページ(範囲)207-212
ページ数6
ジャーナルSurface Science
581
発行部数2-3
DOI
出版物ステータスPublished - 2005 5 1

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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  • これを引用

    Tachiki, M., Kaibara, Y., Sumikawa, Y., Shigeno, M., Kanazawa, H., Banno, T., Song, K. S., Umezawa, H., & Kawarada, H. (2005). Characterization of locally modified diamond surface using Kelvin probe force microscope. Surface Science, 581(2-3), 207-212. https://doi.org/10.1016/j.susc.2005.02.054